Advanced Scanning Electron Microscopy by Echlin Patrick (15 results)
- Hardcover
Seller: ThriftBooks-Atlanta, AUSTELL, GA, U.S.A.ThriftBooks-Atlanta
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Hardcover. Condition: Fair. No Jacket. Readable copy. Pages may have considerable notes/highlighting. ~ ThriftBooks: Read More, Spend Less.
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Echlin, Patrick, Fiori, C.E., Goldstein, Joseph, Joy, David C., Newbury, Dale E.
- Hardcover
Seller: Zubal-Books, Since 1961, Cleveland, OH, U.S.A.Zubal-Books, Since 1961
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Condition: Good. Second printing, 454 pp., hardcover, ex library, else text clean and binding tight (lacks dust jacket). - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required b…y recipient's country.
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Echlin, Patrick; Fiori, C.E.; Goldstein, Joseph; Joy, David C.; Newbury, Dale E.
- Hardcover
Seller: HPB-Red, Dallas, TX, U.S.A.HPB-Red
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hardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority.
Advanced Scanning Electron Microscopy And X-ray Microanalysis
Echlin, Patrick; Fiori, C.E.; Goldstein, Joseph; Joy, David C.; Newbury, Dale E.
- Hardcover
Seller: Romtrade Corp., STERLING HEIGHTS, MI, U.S.A.Romtrade Corp.
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US$ 125.01
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Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Echlin, Patrick; Fiori, C.E.; Goldstein, Joseph; Joy, David C.; Newbury, Dale E.
- Softcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
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US$ 134.81
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Condition: New. In.
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Patrick Echlin|C.E. Fiori|Joseph Goldstein|David C. Joy|Dale E. Newbury
- Softcover
Seller: moluna, Greven, Germanymoluna
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US$ 109.71
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Condition: New.
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Dale E. Newbury David C. Joy Joseph Goldstein C.E. Fiori Patrick Echlin
- Hardcover
Seller: Books Puddle, New York, NY, U.S.A.Books Puddle
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US$ 174.42
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Condition: Used. pp. xii + 454.
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Newbury Dale E. Joy David C. Goldstein Joseph Fiori C.E. Echlin Patrick
- Hardcover
Seller: Majestic Books, Hounslow, United KingdomMajestic Books
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US$ 180.11
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Condition: Used. pp. xii + 454.
Advanced Scanning Electron Microscopy and X-ray Microanalysis
Echlin, Patrick/ Fiori, C. E./ Goldstein, Joseph/ Joy, David C./ Newbury, Dale E.
- Softcover
Seller: Revaluation Books, Exeter, United KingdomRevaluation Books
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US$ 179.62
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Paperback. Condition: Brand New. reprint edition. 466 pages. 8.75x6.00x0.75 inches. In Stock.
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Newbury Dale E. Joy David C. Goldstein Joseph Fiori C.E. Echlin Patrick
- Hardcover
Seller: Biblios, frankfurt am main, HESSE, GermanyBiblios
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US$ 193.63
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Condition: Used. pp. xii + 454.
- Softcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
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US$ 135.97
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materials presented in…the original course, the lecturers collaborated to write the book Practical Scanning Electron Microscopy (PSEM), which was published by Plenum Press in 1975. The course con tinued to evolve and expand in the ensuing years, until the volume of material to be covered necessitated the development of separate intro ductory and advanced courses. In 1981 the lecturers undertook the project of rewriting the original textbook, producing the volume Scan ning Electron Microscopy and X-Ray Microanalysis (SEMXM). This vol ume contained substantial expansions of the treatment of such basic material as electron optics, image formation, energy-dispersive x-ray spectrometry, and qualitative and quantitative analysis. At the same time, a number of chapters, which had been included in the PSEM vol ume, including those on magnetic contrast and electron channeling con trast, had to be dropped for reasons of space. Moreover, these topics had naturally evolved into the basis of the advanced course. In addition, the evolution of the SEM and microanalysis fields had resulted in the devel opment of new topics, such as digital image processing, which by their nature became topics in the advanced course.
- Hardcover
Seller: Mispah books, Redhill, SURRE, United KingdomMispah books
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US$ 247.69
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Hardcover. Condition: Very Good. Dust Jacket may NOT BE INCLUDED.CDs may be missing. SHIPS FROM MULTIPLE LOCATIONS. book.
- Softcover
- Print on Demand
Seller: Brook Bookstore On Demand, Napoli, NA, ItalyBrook Bookstore On Demand
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US$ 102.54
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Condition: new. Questo è un articolo print on demand.
- Softcover
- Print on Demand
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.
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US$ 127.21
US$ 26.55 shippingShips from Germany to U.S.A.Quantity: 2 available
Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materia…ls presented in the original course, the lecturers collaborated to write the book Practical Scanning Electron Microscopy (PSEM), which was published by Plenum Press in 1975. The course con tinued to evolve and expand in the ensuing years, until the volume of material to be covered necessitated the development of separate intro ductory and advanced courses. In 1981 the lecturers undertook the project of rewriting the original textbook, producing the volume Scan ning Electron Microscopy and X-Ray Microanalysis (SEMXM). This vol ume contained substantial expansions of the treatment of such basic material as electron optics, image formation, energy-dispersive x-ray spectrometry, and qualitative and quantitative analysis. At the same time, a number of chapters, which had been included in the PSEM vol ume, including those on magnetic contrast and electron channeling con trast, had to be dropped for reasons of space. Moreover, these topics had naturally evolved into the basis of the advanced course. In addition, the evolution of the SEM and microanalysis fields had resulted in the devel opment of new topics, such as digital image processing, which by their nature became topics in the advanced course. 476 pp. Englisch.
- Softcover
- Print on Demand
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germanybuchversandmimpf2000
Contact seller5-star sellerCondition: New
US$ 127.21
US$ 69.26 shippingShips from Germany to U.S.A.Quantity: 1 available
Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materials p…resented in the original course, the lecturers collaborated to write the book Practical Scanning Electron Microscopy (PSEM), which was published by Plenum Press in 1975. The course con tinued to evolve and expand in the ensuing years, until the volume of material to be covered necessitated the development of separate intro ductory and advanced courses. In 1981 the lecturers undertook the project of rewriting the original textbook, producing the volume Scan ning Electron Microscopy and X-Ray Microanalysis (SEMXM). This vol ume contained substantial expansions of the treatment of such basic material as electron optics, image formation, energy-dispersive x-ray spectrometry, and qualitative and quantitative analysis. At the same time, a number of chapters, which had been included in the PSEM vol ume, including those on magnetic contrast and electron channeling con trast, had to be dropped for reasons of space. Moreover, these topics had naturally evolved into the basis of the advanced course. In addition, the evolution of the SEM and microanalysis fields had resulted in the devel opment of new topics, such as digital image processing, which by their nature became topics in the advanced course.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 476 pp. Englisch.
