Computer Processing Electron Microscope (17 results)
- Hardcover
Seller: Zubal-Books, Since 1961, Cleveland, OH, U.S.A.Zubal-Books, Since 1961
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Condition: Very Good. 296 pp., hardcover, minor internal library markings else text clean & binding tight. - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's…country.
- Hardcover
Seller: books4less (Versandantiquariat Petra Gros GmbH & Co. KG), Welling, Germanybooks4less (Versandantiquariat Petra Gros GmbH & Co. KG)
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US$ 6.98
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gebundene Ausgabe. Condition: Gut. 296 Seiten; Das hier angebotene Buch stammt aus einer teilaufgelösten wissenschaftlichen Bibliothek und trägt die entsprechenden Kennzeichnungen (Rückenschild, Instituts-Stempel.); Schnitt und Einband sind etwas staubschmutzig; der Buchzustand ist ansonsten ordentlich und dem Alter entsprechend… gut. Text in ENGLISCHER Sprache! Sprache: Englisch Gewicht in Gramm: 700.
Language: English
Published by Berlin, Heidelberg, New York, Springer, 1980
- Hardcover
Seller: Antiquariat Thomas Haker GmbH & Co. KG, Berlin, GermanyAntiquariat Thomas Haker GmbH & Co. KG
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Condition: Used
US$ 21.93
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Leinen. 296 S. With illustrations and photos in B/W. Ex.-Library. Good condition. Cover slightly faded and worn. Sprache: Englisch Gewicht in Gramm: 700.
- Hardcover
Seller: Anybook.com, Lincoln, United KingdomAnybook.com
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US$ 27.93
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Condition: Fair. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. Clean from markings. In fair condition, suitable as a study copy. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,750grams, ISBN:0387096221.
Computer Processing of Electron Microscope Images
Hawkes, P. W. (EDT); Frank, J. (CON); Hawkes, P.w. (CON); Hegerl, R. (CON); Hoppe, W. (CON)
- Softcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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Condition: New.
Computer Processing of Electron Microscope Images
Hawkes, P. W. (EDT); Frank, J. (CON); Hawkes, P.w. (CON); Hegerl, R. (CON); Hoppe, W. (CON)
- Softcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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US$ 70.84
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Condition: As New. Unread book in perfect condition.
- Softcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
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US$ 69.05
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Condition: New. In.
- Softcover
Seller: Chiron Media, Wallingford, United KingdomChiron Media
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US$ 64.97
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PF. Condition: New.
Computer Processing of Electron Microscope Images
Hawkes, P. W. (EDT); Frank, J. (CON); Hawkes, P.w. (CON); Hegerl, R. (CON); Hoppe, W. (CON)
- Softcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
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US$ 68.35
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Condition: New.
Published by Springer-Verlag, 1980., 1980
- Hardcover
Seller: The Book Firm, Subiaco, WA, AustraliaThe Book Firm
Contact seller2-star sellerCondition: Used
US$ 43.76
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Hardcover. Ex-library, several marks to covers, otherwise good (no markings to text). No dust jacket. Part of the Topics in Current Physics series, volume 13. 296pp. ISBN 3540096221 or US ISBN 0387096221.
Computer Processing of Electron Microscope Images
Hawkes, P. W. (EDT); Frank, J. (CON); Hawkes, P.w. (CON); Hegerl, R. (CON); Hoppe, W. (CON)
- Softcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
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US$ 76.04
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Condition: As New. Unread book in perfect condition.
- Softcover
Seller: Revaluation Books, Exeter, United KingdomRevaluation Books
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US$ 92.46
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Paperback. Condition: Brand New. reprint edition. 310 pages. 9.60x6.70x0.80 inches. In Stock.
- Softcover
Seller: moluna, Greven, Germanymoluna
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US$ 56.73
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Condition: New.
- Softcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
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US$ 70.33
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Towards the end of the 1960s, a number of quite different circumstances combined to launch a period of intense activity in the digital processing of electron micro graphs. First, many years of work on correcting the resolution-limiting aberrations…of electron microscope objectives had shown that these optical impediments to very high resolution could indeed be overcome, but only at the cost of immense exper imental difficulty; thanks largely to the theoretical work of K. -J. Hanszen and his colleagues and to the experimental work of F. Thon, the notions of transfer func tions were beginning to supplant or complement the concepts of geometrical optics in electron optical thinking; and finally, large fast computers, capable of manipu lating big image matrices in a reasonable time, were widely accessible. Thus the idea that recorded electron microscope images could be improved in some way or rendered more informative by subsequent computer processing gradually gained ground. At first, most effort was concentrated on three-dimensional reconstruction, particu larly of specimens with natural symmetry that could be exploited, and on linear operations on weakly scattering specimens (Chap. l). In 1973, however, R. W. Gerchberg and W. O. Saxton described an iterative algorithm that in principle yielded the phase and amplitude of the electron wave emerging from a strongly scattering speci men.
- Softcover
- Print on Demand
Seller: Brook Bookstore On Demand, Napoli, NA, ItalyBrook Bookstore On Demand
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Condition: new. Questo è un articolo print on demand.
- Softcover
- Print on Demand
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germanybuchversandmimpf2000
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US$ 62.73
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Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Towards the end of the 1960s, a number of quite different circumstances combined to launch a period of intense activity in the digital processing of electron micro graphs. First, many years of work on correcting the resolution-limiting…aberrations of electron microscope objectives had shown that these optical impediments to very high resolution could indeed be overcome, but only at the cost of immense exper imental difficulty; thanks largely to the theoretical work of K. -J. Hanszen and his colleagues and to the experimental work of F. Thon, the notions of transfer func tions were beginning to supplant or complement the concepts of geometrical optics in electron optical thinking; and finally, large fast computers, capable of manipu lating big image matrices in a reasonable time, were widely accessible. Thus the idea that recorded electron microscope images could be improved in some way or rendered more informative by subsequent computer processing gradually gained ground. At first, most effort was concentrated on three-dimensional reconstruction, particu larly of specimens with natural symmetry that could be exploited, and on linear operations on weakly scattering specimens (Chap. l). In 1973, however, R. W. Gerchberg and W. O. Saxton described an iterative algorithm that in principle yielded the phase and amplitude of the electron wave emerging from a strongly scattering speci men.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 316 pp. Englisch.
- Softcover
- Print on Demand
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.
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US$ 125.47
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Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Towards the end of the 1960s, a number of quite different circumstances combined to launch a period of intense activity in the digital processing of electron micro graphs. First, many years of work on correcting the resolution-limit…ing aberrations of electron microscope objectives had shown that these optical impediments to very high resolution could indeed be overcome, but only at the cost of immense exper imental difficulty; thanks largely to the theoretical work of K. -J. Hanszen and his colleagues and to the experimental work of F. Thon, the notions of transfer func tions were beginning to supplant or complement the concepts of geometrical optics in electron optical thinking; and finally, large fast computers, capable of manipu lating big image matrices in a reasonable time, were widely accessible. Thus the idea that recorded electron microscope images could be improved in some way or rendered more informative by subsequent computer processing gradually gained ground. At first, most effort was concentrated on three-dimensional reconstruction, particu larly of specimens with natural symmetry that could be exploited, and on linear operations on weakly scattering specimens (Chap. l). In 1973, however, R. W. Gerchberg and W. O. Saxton described an iterative algorithm that in principle yielded the phase and amplitude of the electron wave emerging from a strongly scattering speci men. 316 pp. Englisch.
