Order Total (1 Item Items):
Shipping Destination:
Defects Microelectronic Materials Devices (31 results)
Skip to main search results
Search filters
Product Type
- All Product Types
- Books (31)
- Magazines & Periodicals (No further results match this refinement)
- Comics (No further results match this refinement)
- Sheet Music (No further results match this refinement)
- Art, Prints & Posters (No further results match this refinement)
- Photographs (No further results match this refinement)
- Maps (No further results match this refinement)
- Manuscripts & Paper Collectibles (No further results match this refinement)
Condition Learn more
- New (25)
- As New, Fine or Near Fine (5)
- Very Good or Good (1)
- Fair or Poor (No further results match this refinement)
- As Described (No further results match this refinement)
Binding
Collectible Attributes
- First Edition (No further results match this refinement)
- Signed (No further results match this refinement)
- Dust Jacket (No further results match this refinement)
- Seller-Supplied Images (12)
- Not Print on Demand (24)
Language (1)
Free Shipping
Seller Location
Seller Rating
-
Condition: Bueno. : Este libro ofrece una visión exhaustiva de los avances recientes en la comprensión de los defectos eléctricamente activos en materiales microelectrónicos, centrándose principalmente en la microelectrónica basada en silicio. La obra pone especial énfasis en aquellos defectos que limitan la calidad, fiabilidad, capacidad de fabricación y respuesta a la radiación de los dispositivos.A través de las perspectivas de destacados teóricos e investigadores, se analizan los defectos en aislantes y semiconductores, así como los mecanismos de fallo relacionados con el hidrógeno. Además, el texto explora materiales semiconductores compuestos para aplicaciones microelectrónicas y examina nueva información obtenida a partir de modelos físicos y de ingeniería, siendo una referencia esencial para ingenieros y científicos del sector. EAN: 9780367386399 Tipo: Libros Categoría: Tecnología|Ciencias Título: Defects in Microelectronic Materials and Devices Autor: Daniel M. Fleetwood| Sokrates T. Pantelides| Ronald D. Schrimpf Editorial: CRC Press Idioma: en Páginas: 770 Formato: tapa blanda.
-
Condition: As New. Unread book in perfect condition.
-
Defects in Microelectronic Materials and Devices
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 89.41
US$ 20.30 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New.
-
Condition: New.
-
Condition: New.
-
US$ 103.41
US$ 8.80 shipping
Ships from United Kingdom to U.S.A.Quantity: 3 available
Add to basketCondition: New.
-
Defects in Microelectronic Materials and Devices
Language: English
Published by Taylor & Francis Ltd, 2019
ISBN 10: 0367386399 ISBN 13: 9780367386399
Seller: THE SAINT BOOKSTORE, Southport, United Kingdom
Seller rating 5 out of 5 stars
US$ 102.77
US$ 17.38 shipping
Ships from United Kingdom to U.S.A.Quantity: 1 available
Add to basketPaperback / softback. Condition: New. New copy - Usually dispatched within 4 working days.
-
Defects in Microelectronic Materials and Devices
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 103.07
US$ 20.30 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: As New. Unread book in perfect condition.
-
Defects in Microelectronic Materials and Devices
Language: English
Published by CRC Press 2019-08-30, 2019
ISBN 10: 0367386399 ISBN 13: 9780367386399
US$ 109.80
US$ 20.97 shipping
Ships from United Kingdom to U.S.A.Quantity: 10 available
Add to basketPaperback. Condition: New.
-
Defects in Microelectronic Materials and Devices
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 118.11
US$ 16.22 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
-
Condition: New. 1st edition NO-PA16APR2015-KAP.
-
US$ 163.71
US$ 20.30 shipping
Ships from United Kingdom to U.S.A.Quantity: 2 available
Add to basketPaperback. Condition: Brand New. 770 pages. 10.00x7.00x1.75 inches. In Stock.
-
Condition: New.
-
HRD. Condition: New. New Book. Shipped from UK. Established seller since 2000.
-
Defects in Microelectronic Materials and Devices
Seller: PBShop.store UK, Fairford, GLOS, United Kingdom
Seller rating 5 out of 5 stars
US$ 266.32
US$ 11.49 shipping
Ships from United Kingdom to U.S.A.Quantity: 1 available
Add to basketHRD. Condition: New. New Book. Shipped from UK. Established seller since 2000.
-
Defects in Microelectronic Materials And Devices
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 266.31
US$ 20.30 shipping
Ships from United Kingdom to U.S.A.Quantity: 1 available
Add to basketCondition: New.
-
Defects in Microelectronic Materials And Devices
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 302.51
US$ 20.30 shipping
Ships from United Kingdom to U.S.A.Quantity: 1 available
Add to basketCondition: As New. Unread book in perfect condition.
-
US$ 291.37
US$ 33.84 shipping
Ships from United Kingdom to U.S.A.Quantity: 1 available
Add to basketHardcover. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
-
Condition: As New. Unread book in perfect condition.
-
Condition: New. Daniel M. Fleetwood, Sokrates T. Pantelides, Ronald D. SchrimpfUncover the Defects that Compromise Performance and ReliabilityAs microelectronics features and devices become smaller and more complex, it is critical that engineers.
-
Defects in Microelectronic Materials and Devices
Language: English
Published by Taylor & Francis Group, 2008
ISBN 10: 1420043765 ISBN 13: 9781420043761
Condition: New. pp. 770.
-
US$ 331.52
US$ 27.07 shipping
Ships from United Kingdom to U.S.A.Quantity: 1 available
Add to basketHardcover. Condition: Brand New. 1st edition. 792 pages. 10.00x7.10x1.50 inches. In Stock.
-
Defects in Microelectronic Materials and Devices
Language: English
Published by Taylor & Francis Group, 2008
ISBN 10: 1420043765 ISBN 13: 9781420043761
Condition: New. pp. 770.
-
Defects in Microelectronic Materials and Devices
Language: English
Published by Taylor & Francis Inc Nov 2008, 2008
ISBN 10: 1420043765 ISBN 13: 9781420043761
Buch. Condition: Neu. Neuware - Focusing primarily on silicon-based microelectronics, Defects in Microelectronic Materials and Devices provides a comprehensive overview of recent progress made in understanding the effects of electrically active defects in microelectronic materials. The book places particular emphasis on defects that limit device quality, reliability, manufacturability, and radiation response. Notable theorists and researchers present their perspectives on defects in insulators and in semiconductors as well as hydrogen and defect-related failure mechanisms. The text also discusses compound semiconductor materials for microelectronic applications and examines new information garnered from physics and engineering models.
-
Defects in Microelectronic Materials and Devices
Language: English
Published by Taylor & Francis Ltd, 2019
ISBN 10: 0367386399 ISBN 13: 9780367386399
Seller: THE SAINT BOOKSTORE, Southport, United Kingdom
Seller rating 5 out of 5 stars
US$ 89.43
US$ 21.32 shipping
Ships from United Kingdom to U.S.A.Quantity: 5 available
Add to basketPaperback / softback. Condition: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days.
-
PAP. Condition: New. New Book. Shipped from UK. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.
-
Defects in Microelectronic Materials and Devices
Seller: PBShop.store UK, Fairford, GLOS, United Kingdom
Seller rating 5 out of 5 stars
US$ 120.07
US$ 11.49 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketPAP. Condition: New. New Book. Delivered from our UK warehouse in 4 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.
-
Condition: New. PRINT ON DEMAND.
-
Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Daniel M. Fleetwood, Sokrates T. Pantelides, Ronald D. SchrimpfUncover the Defects that Compromise Performance and ReliabilityAs microelectronics features and devices become smaller and more complex, it is critical that engineers.
-
Taschenbuch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Focusing primarily on silicon-based microelectronics, Defects in Microelectronic Materials and Devices provides a comprehensive overview of recent progress made in understanding the effects of electrically active defects in microelectronic materials. The book places particular emphasis on defects that limit device quality, reliability, manufacturability, and radiation response. Notable theorists and researchers present their perspectives on defects in insulators and in semiconductors as well as hydrogen and defect-related failure mechanisms. The text also discusses compound semiconductor materials for microelectronic applications and examines new information garnered from physics and engineering models.
