Order Total (1 Item Items):
Shipping Destination:
Delay Fault Testing Vlsi by Krstic Angela (19 results)
Skip to main search results
Search filters
Product Type
- All Product Types
- Books (19)
- Magazines & Periodicals (No further results match this refinement)
- Comics (No further results match this refinement)
- Sheet Music (No further results match this refinement)
- Art, Prints & Posters (No further results match this refinement)
- Photographs (No further results match this refinement)
- Maps (No further results match this refinement)
- Manuscripts & Paper Collectibles (No further results match this refinement)
Condition Learn more
- New (14)
- As New, Fine or Near Fine (3)
- Very Good or Good (1)
- Fair or Poor (No further results match this refinement)
- As Described (1)
Binding
Collectible Attributes
- First Edition (No further results match this refinement)
- Signed (No further results match this refinement)
- Dust Jacket (No further results match this refinement)
- Seller-Supplied Images (2)
- Not Print on Demand (15)
Language (1)
Price
- Any Price
- Under US$ 25 (No further results match this refinement)
- US$ 25 to US$ 50
- Over US$ 50
Free Shipping
Seller Location
Seller Rating
-
Delay Fault Testing for VLSI Circuits
Published by Kluwer Academic Pub, Boston, 1998
ISBN 10: 0792382951 ISBN 13: 9780792382959
Language: English
Hardcover. Condition: Very Fine. First Edition. A very clean, unmarked copy.
-
hardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
-
Hardcover. Condition: Très bon. Ancien livre de bibliothèque. Edition 1998. Ammareal reverse jusqu'à 15% du prix net de cet article à des organisations caritatives. ENGLISH DESCRIPTION Book Condition: Used, Very good. Former library book. Edition 1998. Ammareal gives back up to 15% of this item's net price to charity organizations.
-
Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
-
Brand new book. Fast ship. Please provide full street address as we are not able to ship to P O box address.
-
Condition: New. pp. 212.
-
Condition: New. pp. 212 52:B&W 6.14 x 9.21in or 234 x 156mm (Royal 8vo) Case Laminate on White w/Gloss Lam.
-
Condition: New. pp. 212.
-
Condition: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher.
-
-
-
Delay Fault Testing for VLSI Circuits (Frontiers in Electronic Testing)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 180.92
US$ 15.69 shipping from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
-
Delay Fault Testing for VLSI Circuits (Frontiers in Electronic Testing, 14)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 187.80
US$ 15.69 shipping from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
-
Condition: New. pp. 210.
-
Paperback. Condition: Like New. Like New. book.
-
Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. In the early days of digital design, we were concerned with the logical correctness of circuits. We knew that if we slowed down the clock signal sufficiently, the circuit would function correctly. With improvements in the semiconductor process technology, o.
-
Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. In the early days of digital design, we were concerned with the logical correctness of circuits. We knew that if we slowed down the clock signal sufficiently, the circuit would function correctly. With improvements in the semiconductor process technology, o.
-
Condition: New. Print on Demand pp. 210 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam.
-
Condition: New. PRINT ON DEMAND pp. 210.
