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Developments Integrated Circuit Testing (2 results)
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Developments in Integrated Circuit Testing
Language: English
Published by London: Academic Press, 1987
ISBN 10: 0124967353 ISBN 13: 9780124967359
Seller: Zubal-Books, Since 1961, Cleveland, OH, U.S.A.
Seller rating 5 out of 5 stars
Condition: Good. *Price HAS BEEN REDUCED by 10% until Monday, Jan. 12 (weekend sale item)* 440 pp., hardcover, ex library, else text and binding clean and tight. - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country.
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Developments in Integrated Circuit Testing (Perspectives in Computing)
Language: English
Published by Academic Press Inc.,U.S., 1987
ISBN 10: 0124967353 ISBN 13: 9780124967359
Hardcover. Condition: Bon. Ancien livre de bibliothèque. Traces de pliures sur la couverture. Traces d'usure sur la couverture. Couverture différente. Edition 1987. Ammareal reverse jusqu'à 15% du prix net de cet article à des organisations caritatives. ENGLISH DESCRIPTION Book Condition: Used, Good. Former library book. Traces of creases on the cover. Signs of wear on the cover. Different cover. Edition 1987. Ammareal gives back up to 15% of this item's net price to charity organizations.
