Fringe Automatic Processing Patterns by Juptner Werner (4 results)
- Hardcover
Seller: Versandantiquariat buch-im-speicher, Berlin, , GermanyVersandantiquariat buch-im-speicher
Contact seller5-star sellerCondition: Used - Very good
US$ 20.06
US$ 35.52 shippingShips from Germany to U.S.A.Quantity: 1 available
weißer Org.-Pappb. / hardcover. Condition: Gut. 1. ed. .. 500 S. : Illustr., graph. Darst. ; 25 cm ; Einband etwas berieben und bestoßen, innen sauber und frisch. / Good condition, cover little bumped. Sprache: Englisch Gewicht in Gramm: 1184.
- Hardcover
Seller: Zubal-Books, Since 1961, Cleveland, OH, U.S.A.Zubal-Books, Since 1961
Contact seller5-star sellerCondition: Used - Very good
US$ 68.04
US$ 4.50 shippingShips within U.S.A.Quantity: 1 available
Condition: Very Good. *Price HAS BEEN REDUCED by 10% until Monday, June 22 (weekend SALE item)* 300 pp., hardcover, ex library else text clean and binding tight. - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any add…itional duties, taxes, or fees required by recipient's country.
Published by Akademie Verlag 1997
Seller: Martinton Book Company, martinton, IL, U.S.A.Martinton Book Company
Contact seller5-star sellerNEW in original shrinkwrap. Hardbound.
Language: English
Published by Berlin : Akademie Verlag (Akademie Verlag Series in Optical Metrology ; Vol. 3) 1997
- Hardcover
- First Edition
Seller: Antiquariat Smock, Freiburg, , GermanyAntiquariat Smock
Contact seller5-star sellerCondition: Used - Very good
US$ 106.22
US$ 19.36 shippingShips from Germany to U.S.A.Quantity: 1 available
Condition: Gut. Formateinband: Pappband / gebundene Ausgabe 546 S.; 25 cm 1st Edition; (With many figures); Exemplar aus Institutsbibliothek mit Standortschild am Rücken, Stempel u. kl. Barcodeklebern; sonst in gutem Zustand. Sprache: Englisch Gewicht in Gramm: 1600 [Stichwörter: Interferogramm ; Bildauswertung ; Kongress Bremen… 1997 / New methods for automatic Fringe Processing, Optical methods for wide scale shape measurement, Optical methods for wide scale displacement measurement, Hybrid measurement technologies on optical metrology, measurement systems for optical metrology etc.].
