Identification Defects Semiconductors (8 results)
Microscopic Identification of Electronic Defects in Semiconductors (Materials Research Society Symposia Proceedings, Volume 46)
Johnson, Noble M., Stephen G. Bishop, and George D. Watkins, editors
- Hardcover
Seller: BookDepart, Shepherdstown, WV, U.S.A.BookDepart
Contact seller5-star sellerCondition: Used - Good
US$ 32.12
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Hardcover. Condition: UsedGood. Hardcover; symposium held April 15-18, 1985, in San Francisco; fading and shelf wear to exterior; binding slightly cocked; scrape to side edge of front cover; note written on table of contents page, otherwise text is clean; former owner's stamping inside rear board; contents in good condition.
- Hardcover
Seller: Romtrade Corp., STERLING HEIGHTS, MI, U.S.A.Romtrade Corp.
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US$ 139.77
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Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
- Hardcover
Seller: Basi6 International, Irving, TX, U.S.A.Basi6 International
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US$ 139.77
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Condition: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
- Hardcover
Seller: Buchpark, Trebbin, GermanyBuchpark
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US$ 130.62
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Condition: Sehr gut. Zustand: Sehr gut | Seiten: 434 | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar.
Identification of Defects in Semiconductors (Volume 51B) (Semiconductors and Semimetals, Volume 51B)
- Hardcover
Seller: Mispah books, Redhill, SURRE, United KingdomMispah books
Contact seller4-star sellerCondition: Used - As new
US$ 254.92
US$ 32.91 shippingShips from United Kingdom to U.S.A.Quantity: 1 available
Hardcover. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
- Softcover
Seller: Revaluation Books, Exeter, United KingdomRevaluation Books
Contact seller5-star sellerCondition: New
US$ 365.26
US$ 16.46 shippingShips from United Kingdom to U.S.A.Quantity: 1 available
Paperback. Condition: Brand New. 396 pages. 9.00x5.75x0.90 inches. In Stock.
- Hardcover
- First Edition
Seller: Saul54, Lynn, MA, U.S.A.Saul54
Contact seller5-star sellerCondition: New
US$ 459.00
US$ 8.00 shippingShips within U.S.A.Quantity: 1 available
Hardcover. Condition: New. No Jacket. 1st Edition. Academic Press (1998). New Hardcover, no dj. Naroon cloth Gilt Front and Spine titles. 9.25"x6.25"x1.1". be42744.
Identification of Defects in Semiconductors (Volume 51B) (Semiconductors and Semimetals, Volume 51B)
Published by Academic Press 1998
- Hardcover
Seller: HPB-Red, Dallas, TX, U.S.A.HPB-Red
Contact seller5-star sellerCondition: Used - Fair
US$ 127.61
US$ 3.75 shippingShips within U.S.A.Quantity: 1 available
Hardcover. Condition: Acceptable. Connecting readers with great books since 1972. Used textbooks may not include companion materials such as access codes, etc. May have condition issues including wear and notes/highlighting. We ship orders daily and Customer Service is our top priority.
