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Logic Memory Experiments Using by Larsen David (7 results)
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Logic and Memory Experiments: Using Ttl Intergrated Circuits
Seller: Once Upon A Time Books, Siloam Springs, AR, U.S.A.
Seller rating 4 out of 5 stars
Paperback. Condition: Acceptable. This is a used book. It may contain highlighting/underlining and/or the book may show heavier signs of wear . It may also be ex-library or without dustjacket. This is a used book. It may contain highlighting/underlining and/or the book may show heavier signs of wear . It may also be ex-library or without dustjacket.
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paperback. Condition: Good. The item is in good condition and works perfectly, however it is showing some signs of previous ownership which could include: small tears, scuffing, notes, highlighting, gift inscriptions, and library markings.
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Logic & memory experiments using TTL integrated circuits (Blacksburg continuing education series)
Seller: Wonder Book, Frederick, MD, U.S.A.
Seller rating 5 out of 5 stars
Condition: Good. Good condition. A copy that has been read but remains intact. May contain markings such as bookplates, stamps, limited notes and highlighting, or a few light stains.
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The Bugbook I: Logic & Memory Experiments Using TTL Integrated Circuits
Language: English
Published by E & L Instruments, Inc., 1978
ISBN 10: 0897040007 ISBN 13: 9780897040006
Seller: Grey Matter Books, Hadley, MA, U.S.A.
Association Member: SNEAB
Seller rating 4 out of 5 stars
Paperback. Condition: Very Good. Volume I ONLY. Eighth printing. Text and diagrams are unmarked; pages are bright, though the page edges are age toned. The binding leans and the spine is creased. Covers are shelf rubbed and show some wear around the edges.
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Logic & memory experiments using TTL integrated circuits (Blacksburg continuing education series)
Published by H. W. Sams
ISBN 10: 0897040007 ISBN 13: 9780897040006
Paperback. Condition: Good. No Jacket. Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less.
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Paperback. Condition: new. Excellent Condition.Excels in customer satisfaction, prompt replies, and quality checks.
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The BUGBOOK 1. Logic & Memory Experiments. Using TTL Itegrated Circuits.
Language: German
Published by E&L Instruments INC:, 1974
Softcover/Paperback. Condition: Gut. Sofort verfügbar Versand am folgenden Arbeitstag mit Rechnung daily shipping wordwide with invoice ex library aus Bibliothek Sprache: Deutsch Gewicht in Gramm: 550.
