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Logic Memory Experiments Using by Larsen David (6 results)
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paperback. Condition: Good. The item is in good condition and works perfectly, however it is showing some signs of previous ownership which could include: small tears, scuffing, notes, highlighting, gift inscriptions, and library markings.
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Logic & memory experiments using TTL integrated circuits (Blacksburg continuing education series)
Published by H. W. Sams
ISBN 10: 0897040007 ISBN 13: 9780897040006
Paperback. Condition: Good. No Jacket. Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less.
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Logic and Memory Experiments: Using Ttl Intergrated Circuits
Seller: Once Upon A Time Books, Siloam Springs, AR, U.S.A.
Seller rating 4 out of 5 stars
Paperback. Condition: Acceptable. This is a used book. It may contain highlighting/underlining and/or the book may show heavier signs of wear . It may also be ex-library or without dustjacket. This is a used book. It may contain highlighting/underlining and/or the book may show heavier signs of wear . It may also be ex-library or without dustjacket.
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Condition: New. Satisfaction Guaranteed or your money back.
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Paperback. Condition: new. Excellent Condition.Excels in customer satisfaction, prompt replies, and quality checks.
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The BUGBOOK 1. Logic & Memory Experiments. Using TTL Itegrated Circuits.
Language: German
Published by E&L Instruments INC:, 1974
Softcover/Paperback. Condition: Gut. Versand am folgenden Arbeitstag mit Rechnung daily shipping wordwide with invoice ex library aus Bibliothek Sprache: Deutsch Gewicht in Gramm: 550.
