Materials Processing Using Plasma by Hassan Muhammad (3 results)

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  • Language: English

    Published by VDM Verlag Dr. Müller, 2010

    3639276639 / 9783639276633

    • Softcover

    Seller: preigu, Osnabrück, Germanypreigu

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    Taschenbuch. Condition: Neu. Materials Processing Using Plasma Focus | Plasma Characterization and Processing of Industrial Materials | Muhammad Hassan | Taschenbuch | Englisch | VDM Verlag Dr. Müller | EAN 9783639276633 | Verantwortliche Person für die EU: VDM Verlag Dr. Müller, Brivibas Gatve 197, 1039 RIGA, LETTLAND, customerservice[at]vdm-vsg[dot]de | Anbieter: preigu. …

  • Language: English

    Published by VDM Verlag Dr. Müller, 2010

    3639276639 / 9783639276633

    • Softcover

    Seller: Mispah books, Redhill, SURRE, United KingdomMispah books

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    Paperback. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

  • Language: English

    Published by VDM Verlag Dr. Müller, 2010

    3639276639 / 9783639276633

    • Softcover
    • Print on Demand

    Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH

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    Taschenbuch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - The present research work reports the parametric study of ion beams emitted from two different Mather type plasma focus devices and their utilization in materials processing. Experiments have been conducted by using a conventional 2.3 kJ UNU/ICTP plasma focus device and the NX2 device (a repetitive plasma focus). The ion parameters such as energy, energy distribution, number density and current density are evaluated in the ambient gas pressure by employing a BPX65 photodiode and a Faraday cup (FC) using time of flight technique. A major motivation is to establish the optimum processing conditions for ion nitriding, surface modification, phase changes and carburizing of materials of industrial interest like Ti, AlFe1.8Zn0.8 alloy and SS-321 in plasma environment. The processed samples are characterized for structural and morphological changes, compositional profile and surface hardness by employing XRD, SEM FESEM, EDX, XPS, Raman spectroscopy and Vickers microhardness test. The SRIM code and microindentation measurements are used to estimate the depth profile of the modified layers.…