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Power Constrained Testing Vlsi Circuits by Nicolici Nicola (21 results)
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Hardcover. Condition: Used: Good. 2003 hardcover no dj as issued xlibrary copy withdrawn stamp on edge of pages/ in book clean text 178 pages::: J-10.
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Power-Constrained Testing of VLSI Circuits (Frontiers in Electronic Testing)
Seller: Zubal-Books, Since 1961, Cleveland, OH, U.S.A.
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Condition: Good. *Price HAS BEEN temporarily REDUCED by 10% until Monday, Sept. 8 (sale item)* 178 pp., Hardcover, ex library else text clean and binding tight. - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country.
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Condition: New. SUPER FAST SHIPPING.
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US$ 116.06
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US$ 116.44
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Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing)
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Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing, 22B)
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US$ 144.48
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Power-constrained Testing of Vlsi Circuits
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Condition: New. pp. 192.
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US$ 176.12
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Add to basketPaperback. Condition: Brand New. 180 pages. 9.25x6.10x0.44 inches. In Stock.
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Power-constrained Testing of Vlsi Circuits
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
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US$ 201.72
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US$ 111.39
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Add to basketCondition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This text focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. It surveys existing techniques and presents several test automation techniques for redu.
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US$ 111.39
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Add to basketGebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This text focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. It surveys existing techniques and presents several test automation techniques for redu.
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Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard
Published by Springer-Verlag New York Inc., 2010
ISBN 10: 1441953159 ISBN 13: 9781441953155
Language: English
Seller: THE SAINT BOOKSTORE, Southport, United Kingdom
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US$ 159.53
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Add to basketPaperback / softback. Condition: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days 329.
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Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard
Published by Springer-Verlag New York Inc., 2003
ISBN 10: 140207235X ISBN 13: 9781402072352
Language: English
Seller: THE SAINT BOOKSTORE, Southport, United Kingdom
Seller rating 5 out of 5 stars
US$ 160.82
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Add to basketHardback. Condition: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days 1020.
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US$ 170.56
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Add to basketCondition: New. Print on Demand pp. 192 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam.
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US$ 186.50
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Add to basketCondition: New. PRINT ON DEMAND pp. 192.
