Seller: Textsellers, Hampton, NH, U.S.A.
Hardcover. Condition: Very Good. No Jacket. Hardcover, 204 pp. Name on ffep, light cover wear, one corner fold, else text clean. Book.
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Seller: GreatBookPrices, Columbia, MD, U.S.A.
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Seller: GreatBookPrices, Columbia, MD, U.S.A.
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Published by Kluwer Academic Publishers, Dordrecht, 1993
ISBN 10: 0792394003 ISBN 13: 9780792394006
Language: English
Seller: Grand Eagle Retail, Bensenville, IL, U.S.A.
Hardcover. Condition: new. Hardcover. Simultaneous Switching Noise (SSN) of CMOS Devices and Systems covers recent research on package-induced noise problems in single and multi-chip package assemblies. It examines in detail the methods for calculating SSN and overall noise containment in a system. In addition, the authors discuss SSN models and algorithms and a SSN Simulator (SSNS) to calculate the maximum SSN and/or the minimum number of power/ground bon-pad/package-pin connections required for a given system design. These algorithms are extremely powerful in calculating SSN for a large number of output drivers switching simultaneously. Design, package and system engineers will find specific information on a number of important topics and techniques. Among these are: . Detailed methods of modeling chip-package interface parasitics; . SSN modeling for CMOS-based systems, including the negative feedback effects; . Model development and time-domain signal integrity simulations for signal conductors over a perforated and/or noisy reference plane; . Total noise budgeting and dynamic noise immunity study for receivers; . Custom CMOS output driver design techniques to minimize package-induced noise.The result and techniques presented in Simultaneous Switching Noise of CMOS Devices and Systems will be useful both to experienced engineers in packaging and systems areas and also to students entering these field. It will serve as an excellent reference and as a text for advanced courses in CMOS systems design and/or electronic packaging. This book is the first in a new sub-series within SECS. The sub-series is entitled 'Electronic Packaging and Interconnects', and the consulting editor is John L. Prince of the University of Arizona. This monograph presents our recent research on Simultaneous Switching Noise (SSN) and related issues for CMOS based systems. Through this monograph, we hope that we have shown the necessity of interactions that are essential between chip design, system design and package design engineers to design and manufacture optimal packaged systems. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
Seller: Lucky's Textbooks, Dallas, TX, U.S.A.
US$ 116.06
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Seller: Lucky's Textbooks, Dallas, TX, U.S.A.
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Seller: GreatBookPrices, Columbia, MD, U.S.A.
Condition: As New. Unread book in perfect condition.
Seller: GreatBookPrices, Columbia, MD, U.S.A.
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Seller: Ria Christie Collections, Uxbridge, United Kingdom
US$ 129.95
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Seller: GreatBookPricesUK, Woodford Green, United Kingdom
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Seller: Ria Christie Collections, Uxbridge, United Kingdom
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Seller: GreatBookPricesUK, Woodford Green, United Kingdom
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Condition: New. pp. 232.
Condition: New. pp. 232.
Published by Kluwer Academic Publishers, 1993
ISBN 10: 0792394003 ISBN 13: 9780792394006
Language: English
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
US$ 180.85
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Add to basketCondition: New. Covers research on package-induced noise problems in single and multi-chip package assemblies. This book examines the methods for calculating SSN and overall noise containment in a system. It is suitable for experienced engineers in packaging and systems areas and also for students entering these fields. Series: The Springer International Series in Engineering and Computer Science. Num Pages: 205 pages, biography. BIC Classification: TJFC; TJFD. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 234 x 156 x 14. Weight in Grams: 504. . 1993. Hardback. . . . .
Seller: Revaluation Books, Exeter, United Kingdom
US$ 177.20
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Add to basketPaperback. Condition: Brand New. 226 pages. 9.30x6.20x0.60 inches. In Stock.
Published by Kluwer Academic Publishers, 1993
ISBN 10: 0792394003 ISBN 13: 9780792394006
Language: English
Seller: Kennys Bookstore, Olney, MD, U.S.A.
Condition: New. Covers research on package-induced noise problems in single and multi-chip package assemblies. This book examines the methods for calculating SSN and overall noise containment in a system. It is suitable for experienced engineers in packaging and systems areas and also for students entering these fields. Series: The Springer International Series in Engineering and Computer Science. Num Pages: 205 pages, biography. BIC Classification: TJFC; TJFD. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 234 x 156 x 14. Weight in Grams: 504. . 1993. Hardback. . . . . Books ship from the US and Ireland.
Published by Kluwer Academic Publishers, Dordrecht, 1993
ISBN 10: 0792394003 ISBN 13: 9780792394006
Language: English
Seller: AussieBookSeller, Truganina, VIC, Australia
US$ 238.73
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Add to basketHardcover. Condition: new. Hardcover. Simultaneous Switching Noise (SSN) of CMOS Devices and Systems covers recent research on package-induced noise problems in single and multi-chip package assemblies. It examines in detail the methods for calculating SSN and overall noise containment in a system. In addition, the authors discuss SSN models and algorithms and a SSN Simulator (SSNS) to calculate the maximum SSN and/or the minimum number of power/ground bon-pad/package-pin connections required for a given system design. These algorithms are extremely powerful in calculating SSN for a large number of output drivers switching simultaneously. Design, package and system engineers will find specific information on a number of important topics and techniques. Among these are: . Detailed methods of modeling chip-package interface parasitics; . SSN modeling for CMOS-based systems, including the negative feedback effects; . Model development and time-domain signal integrity simulations for signal conductors over a perforated and/or noisy reference plane; . Total noise budgeting and dynamic noise immunity study for receivers; . Custom CMOS output driver design techniques to minimize package-induced noise.The result and techniques presented in Simultaneous Switching Noise of CMOS Devices and Systems will be useful both to experienced engineers in packaging and systems areas and also to students entering these field. It will serve as an excellent reference and as a text for advanced courses in CMOS systems design and/or electronic packaging. This book is the first in a new sub-series within SECS. The sub-series is entitled 'Electronic Packaging and Interconnects', and the consulting editor is John L. Prince of the University of Arizona. This monograph presents our recent research on Simultaneous Switching Noise (SSN) and related issues for CMOS based systems. Through this monograph, we hope that we have shown the necessity of interactions that are essential between chip design, system design and package design engineers to design and manufacture optimal packaged systems. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.
Seller: moluna, Greven, Germany
US$ 110.68
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Add to basketCondition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This monograph presents our recent research on Simultaneous Switching Noise (SSN) and related issues for CMOS based systems. Although some SSN related work was previously reported in the literature, it were mainly for Emitter Coupled Logic (ECL) gates using.
Seller: moluna, Greven, Germany
US$ 110.68
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Add to basketGebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This monograph presents our recent research on Simultaneous Switching Noise (SSN) and related issues for CMOS based systems. Although some SSN related work was previously reported in the literature, it were mainly for Emitter Coupled Logic (ECL) gates using.
Seller: THE SAINT BOOKSTORE, Southport, United Kingdom
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Add to basketHardback. Condition: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days 597.
Seller: Majestic Books, Hounslow, United Kingdom
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Add to basketCondition: New. Print on Demand pp. 232 52:B&W 6.14 x 9.21in or 234 x 156mm (Royal 8vo) Case Laminate on White w/Gloss Lam.
Seller: Majestic Books, Hounslow, United Kingdom
US$ 170.14
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Add to basketCondition: New. Print on Demand pp. 232 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam.
Seller: Biblios, Frankfurt am main, HESSE, Germany
US$ 182.32
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Add to basketCondition: New. PRINT ON DEMAND pp. 232.
Seller: Biblios, Frankfurt am main, HESSE, Germany
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Add to basketCondition: New. PRINT ON DEMAND pp. 232.