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Soft Error Mechanisms Modeling by Sayil Selahattin (25 results)
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Soft Error Mechanisms, Modeling and Mitigation
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Soft Error Mechanisms, Modeling and Mitigation
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Condition: New. pp. XI, 105 81 illus., 35 illus. in color. 1 Edition NO-PA16APR2015-KAP.
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Soft Error Mechanisms, Modeling and Mitigation
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Soft Error Mechanisms, Modeling and Mitigation
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Soft Error Mechanisms, Modeling and Mitigation
Published by Springer International Publishing, Springer International Publishing Mär 2016, 2016
ISBN 10: 3319306065 ISBN 13: 9783319306063
Language: English
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
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Add to basketBuch. Condition: Neu. Neuware -This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects. In addition to discussing various radiation hardening techniques for combinational logic, the author also describes new mitigation strategies targeting commercial designs. Coverage includes novel soft error mitigation techniques such as the Dynamic Threshold Technique and Soft Error Filtering based on Transmission gate with varied gate and body bias. The discussion also includes modeling of SE crosstalk noise, delay and speed-up effects. Various mitigation strategies to eliminate SE coupling effects are also introduced. Coverage also includes the reliability of low power energy-efficient designs and the impact of leakage power consumption optimizations on soft error robustness. The author presents an analysis of various power optimization techniques, enabling readers to make design choices that reduce static power consumption and improve soft error reliability at the same time.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 120 pp. Englisch.
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Soft Error Mechanisms, Modeling and Mitigation
Published by Springer International Publishing, 2016
ISBN 10: 3319306065 ISBN 13: 9783319306063
Language: English
US$ 65.15
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Add to basketBuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects. In addition to discussing various radiation hardening techniques for combinational logic, the author also describes new mitigation strategies targeting commercial designs. Coverage includes novel soft error mitigation techniques such as the Dynamic Threshold Technique and Soft Error Filtering based on Transmission gate with varied gate and body bias. The discussion also includes modeling of SE crosstalk noise, delay and speed-up effects. Various mitigation strategies to eliminate SE coupling effects are also introduced. Coverage also includes the reliability of low power energy-efficient designs and the impact of leakage power consumption optimizations on soft error robustness. The author presents an analysis of various power optimization techniques, enabling readers to make design choices that reduce static power consumption and improve soft error reliability at the same time.
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Soft Error Mechanisms, Modeling and Mitigation
Published by Springer, Berlin, Springer International Publishing, Springer, 2018
ISBN 10: 3319808486 ISBN 13: 9783319808482
Language: English
US$ 70.26
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Add to basketTaschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects. In addition to discussing various radiation hardening techniques for combinational logic, the author also describes new mitigation strategies targeting commercial designs. Coverage includes novel soft error mitigation techniques such as the Dynamic Threshold Technique and Soft Error Filtering based on Transmission gate with varied gate and body bias. The discussion also includes modeling of SE crosstalk noise, delay and speed-up effects. Various mitigation strategies to eliminate SE coupling effects are also introduced. Coverage also includes the reliability of low power energy-efficient designs and the impact of leakage power consumption optimizations on soft error robustness. The author presents an analysis of various power optimization techniques, enabling readers to make design choices that reduce static power consumption and improve soft error reliability at the same time.
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Soft Error Mechanisms, Modeling and Mitigation
Published by Springer International Publishing, 2016
ISBN 10: 3319306065 ISBN 13: 9783319306063
Language: English
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Add to basketCondition: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher.
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Soft Error Mechanisms, Modeling and Mitigation
Published by Berlin Springer International Publishing Springer Jun 2018, 2018
ISBN 10: 3319808486 ISBN 13: 9783319808482
Language: English
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
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US$ 65.15
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Add to basketTaschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects. In addition to discussing various radiation hardening techniques for combinational logic, the author also describes new mitigation strategies targeting commercial designs. Coverage includes novel soft error mitigation techniques such as the Dynamic Threshold Technique and Soft Error Filtering based on Transmission gate with varied gate and body bias. The discussion also includes modeling of SE crosstalk noise, delay and speed-up effects. Various mitigation strategies to eliminate SE coupling effects are also introduced. Coverage also includes the reliability of low power energy-efficient designs and the impact of leakage power consumption optimizations on soft error robustness. The author presents an analysis of various power optimization techniques, enabling readers to make design choices that reduce static power consumption and improve soft error reliability at the same time. 105 pp. Englisch.
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Soft Error Mechanisms, Modeling and Mitigation
Published by Springer International Publishing Mrz 2016, 2016
ISBN 10: 3319306065 ISBN 13: 9783319306063
Language: English
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
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Add to basketBuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects. In addition to discussing various radiation hardening techniques for combinational logic, the author also describes new mitigation strategies targeting commercial designs. Coverage includes novel soft error mitigation techniques such as the Dynamic Threshold Technique and Soft Error Filtering based on Transmission gate with varied gate and body bias. The discussion also includes modeling of SE crosstalk noise, delay and speed-up effects. Various mitigation strategies to eliminate SE coupling effects are also introduced. Coverage also includes the reliability of low power energy-efficient designs and the impact of leakage power consumption optimizations on soft error robustness. The author presents an analysis of various power optimization techniques, enabling readers to make design choices that reduce static power consumption and improve soft error reliability at the same time. 120 pp. Englisch.
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Add to basketCondition: New. Print on Demand pp. XI, 105 81 illus., 35 illus. in color.
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Add to basketCondition: New. PRINT ON DEMAND pp. XI, 105 81 illus., 35 illus. in color.
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Soft Error Mechanisms, Modeling and Mitigation
Published by Springer International Publishing, 2016
ISBN 10: 3319306065 ISBN 13: 9783319306063
Language: English
US$ 58.92
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Add to basketGebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced jitter and race, single event coupling noise, delay and speed-up effects and then compares coupling induced noise and delay effects to single event trans.
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Soft Error Mechanisms, Modeling and Mitigation
Published by Springer International Publishing, 2018
ISBN 10: 3319808486 ISBN 13: 9783319808482
Language: English
US$ 59.37
Convert currencyUS$ 57.93 shipping from Germany to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced jitter and race, single event coupling noise, delay and speed-up effects and then compares coupling induced noise and delay effects to single event trans.
