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Soft Error Mechanisms Modeling by Sayil Selahattin (25 results)
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Condition: New.
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Condition: New.
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Condition: New.
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Condition: As New. Unread book in perfect condition.
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Condition: New.
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Condition: New. pp. XI, 105 81 illus., 35 illus. in color. 1 Edition NO-PA16APR2015-KAP.
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Soft Error Mechanisms, Modeling and Mitigation
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 64.89
US$ 15.76 shipping from United Kingdom to U.S.A.Quantity: Over 20 available
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Paperback. Condition: New.
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Soft Error Mechanisms, Modeling and Mitigation
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 68.87
US$ 15.76 shipping from United Kingdom to U.S.A.Quantity: Over 20 available
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Soft Error Mechanisms, Modeling and Mitigation
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 68.86
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Soft Error Mechanisms, Modeling and Mitigation
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 75.56
US$ 19.74 shipping from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: As New. Unread book in perfect condition.
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Hardcover. Condition: Brand New. 9.25x6.25x0.50 inches. In Stock.
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Soft Error Mechanisms, Modeling and Mitigation
Published by Springer International Publishing, Springer International Publishing Mär 2016, 2016
ISBN 10: 3319306065 ISBN 13: 9783319306063
Language: English
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
Seller rating 5 out of 5 stars
Buch. Condition: Neu. Neuware -This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects. In addition to discussing various radiation hardening techniques for combinational logic, the author also describes new mitigation strategies targeting commercial designs. Coverage includes novel soft error mitigation techniques such as the Dynamic Threshold Technique and Soft Error Filtering based on Transmission gate with varied gate and body bias. The discussion also includes modeling of SE crosstalk noise, delay and speed-up effects. Various mitigation strategies to eliminate SE coupling effects are also introduced. Coverage also includes the reliability of low power energy-efficient designs and the impact of leakage power consumption optimizations on soft error robustness. The author presents an analysis of various power optimization techniques, enabling readers to make design choices that reduce static power consumption and improve soft error reliability at the same time.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 120 pp. Englisch.
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Soft Error Mechanisms, Modeling and Mitigation
Published by Springer International Publishing, 2016
ISBN 10: 3319306065 ISBN 13: 9783319306063
Language: English
Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects. In addition to discussing various radiation hardening techniques for combinational logic, the author also describes new mitigation strategies targeting commercial designs. Coverage includes novel soft error mitigation techniques such as the Dynamic Threshold Technique and Soft Error Filtering based on Transmission gate with varied gate and body bias. The discussion also includes modeling of SE crosstalk noise, delay and speed-up effects. Various mitigation strategies to eliminate SE coupling effects are also introduced. Coverage also includes the reliability of low power energy-efficient designs and the impact of leakage power consumption optimizations on soft error robustness. The author presents an analysis of various power optimization techniques, enabling readers to make design choices that reduce static power consumption and improve soft error reliability at the same time.
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Soft Error Mechanisms, Modeling and Mitigation
Published by Springer, Berlin, Springer International Publishing, Springer, 2018
ISBN 10: 3319808486 ISBN 13: 9783319808482
Language: English
Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects. In addition to discussing various radiation hardening techniques for combinational logic, the author also describes new mitigation strategies targeting commercial designs. Coverage includes novel soft error mitigation techniques such as the Dynamic Threshold Technique and Soft Error Filtering based on Transmission gate with varied gate and body bias. The discussion also includes modeling of SE crosstalk noise, delay and speed-up effects. Various mitigation strategies to eliminate SE coupling effects are also introduced. Coverage also includes the reliability of low power energy-efficient designs and the impact of leakage power consumption optimizations on soft error robustness. The author presents an analysis of various power optimization techniques, enabling readers to make design choices that reduce static power consumption and improve soft error reliability at the same time.
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Taschenbuch. Condition: Neu. Soft Error Mechanisms, Modeling and Mitigation | Selahattin Sayil | Taschenbuch | Previously published in hardcover | xi | Englisch | 2018 | Springer | EAN 9783319808482 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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Paperback. Condition: New. New. book.
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Soft Error Mechanisms, Modeling and Mitigation
Published by Springer International Publishing, 2016
ISBN 10: 3319306065 ISBN 13: 9783319306063
Language: English
Condition: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher.
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Soft Error Mechanisms, Modeling and Mitigation
Published by Berlin Springer International Publishing Springer Jun 2018, 2018
ISBN 10: 3319808486 ISBN 13: 9783319808482
Language: English
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects. In addition to discussing various radiation hardening techniques for combinational logic, the author also describes new mitigation strategies targeting commercial designs. Coverage includes novel soft error mitigation techniques such as the Dynamic Threshold Technique and Soft Error Filtering based on Transmission gate with varied gate and body bias. The discussion also includes modeling of SE crosstalk noise, delay and speed-up effects. Various mitigation strategies to eliminate SE coupling effects are also introduced. Coverage also includes the reliability of low power energy-efficient designs and the impact of leakage power consumption optimizations on soft error robustness. The author presents an analysis of various power optimization techniques, enabling readers to make design choices that reduce static power consumption and improve soft error reliability at the same time. 105 pp. Englisch.
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Soft Error Mechanisms, Modeling and Mitigation
Published by Springer International Publishing Mrz 2016, 2016
ISBN 10: 3319306065 ISBN 13: 9783319306063
Language: English
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects. In addition to discussing various radiation hardening techniques for combinational logic, the author also describes new mitigation strategies targeting commercial designs. Coverage includes novel soft error mitigation techniques such as the Dynamic Threshold Technique and Soft Error Filtering based on Transmission gate with varied gate and body bias. The discussion also includes modeling of SE crosstalk noise, delay and speed-up effects. Various mitigation strategies to eliminate SE coupling effects are also introduced. Coverage also includes the reliability of low power energy-efficient designs and the impact of leakage power consumption optimizations on soft error robustness. The author presents an analysis of various power optimization techniques, enabling readers to make design choices that reduce static power consumption and improve soft error reliability at the same time. 120 pp. Englisch.
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Condition: New. Print on Demand pp. XI, 105 81 illus., 35 illus. in color.
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Condition: New. PRINT ON DEMAND pp. XI, 105 81 illus., 35 illus. in color.
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Soft Error Mechanisms, Modeling and Mitigation
Published by Springer International Publishing, 2016
ISBN 10: 3319306065 ISBN 13: 9783319306063
Language: English
Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced jitter and race, single event coupling noise, delay and speed-up effects and then compares coupling induced noise and delay effects to single event trans.
-
Soft Error Mechanisms, Modeling and Mitigation
Published by Springer International Publishing, 2018
ISBN 10: 3319808486 ISBN 13: 9783319808482
Language: English
Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced jitter and race, single event coupling noise, delay and speed-up effects and then compares coupling induced noise and delay effects to single event trans.
-
Soft Error Mechanisms, Modeling and Mitigation
Published by Springer International Publishing, 2016
ISBN 10: 3319306065 ISBN 13: 9783319306063
Language: English
Buch. Condition: Neu. Soft Error Mechanisms, Modeling and Mitigation | Selahattin Sayil | Buch | xi | Englisch | 2016 | Springer International Publishing | EAN 9783319306063 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu Print on Demand.
