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Next Generation Technology-Enhanced Assessment (Educational and Psychological Testing in a Global Context)
Book 2 of 6: Educational and Psychological Testing in a Global ContextLanguage: English
Published by Cambridge University Press (edition ), 2020
ISBN 10: 1107561531 ISBN 13: 9781107561533
Paperback. Condition: Very Good. It's a well-cared-for item that has seen limited use. The item may show minor signs of wear. All the text is legible, with all pages included. It may have slight markings and/or highlighting.
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Next Generation Technology-Enhanced Assessment: Global Perspectives on Occupational and Workplace Testing
Book 2 of 6: Educational and Psychological Testing in a Global ContextLanguage: English
Published by Cambridge University Press, 2020
ISBN 10: 1107561531 ISBN 13: 9781107561533
Paperback. Condition: Very Good. No Jacket. May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less.
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Next Generation Technology-Enhanced Assessment (Educational and Psychological Testing in a Global Context)
Book 2 of 6: Educational and Psychological Testing in a Global ContextLanguage: English
Published by Cambridge University Press, 2020
ISBN 10: 1107561531 ISBN 13: 9781107561533
Condition: Very Good. . . Before placing your order for please contact us for confirmation on the book's binding. Check out our other listings to add to your order for discounted shipping. All orders guaranteed and ship within 24 hours.
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Hardcover. Condition: Good. No Jacket. Former library book; Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less.
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Hardcover. Condition: Very Good. No Jacket. May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less.
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Hardcover. Condition: Good. No Jacket. Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less.
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Hardcover. Condition: Very Good. ***Tear on Dj***Vol 2***.
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Auto Electricity and Electronics Technology : Principles, Diagnosis, Testing, and Service of All Major Electrical, Electronic, and Computer Control Systems
Language: English
Published by Goodheart-Willcox Pub, 2004
ISBN 10: 1590702719 ISBN 13: 9781590702710
Condition: Good. Former library copy. Pages intact with minimal writing/highlighting. The binding may be loose and creased. Dust jackets/supplements are not included. Includes library markings. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.
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Hardcover. Condition: Very Good. Measuring and Testing in Science and Technology: An Introduction This book is in very good condition and will be shipped within 24 hours of ordering. The cover may have some limited signs of wear but the pages are clean, intact and the spine remains undamaged. This book has clearly been well maintained and looked after thus far. Money back guarantee if you are not satisfied. See all our books here, order more than 1 book and get discounted shipping. .
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Measuring and Testing in Science and Technology: An Introduction
Seller: BoundlessBookstore, Wallingford, United Kingdom
Seller rating 5 out of 5 stars
Condition: Good. Boards are clean. Content is clean with even toning. Good DJ with some toning.
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Condition: As New. Unread book in perfect condition.
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paperback. Condition: Very Good. Connecting readers with great books since 1972! Used books may not include companion materials, and may have some shelf wear or limited writing. We ship orders daily and Customer Service is our top priority!
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Paperback or Softback. Condition: New. Baseline Testing of Ultracapacitors for the Next Generation Launch Technology (Nglt) Project. Book.
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Condition: As New. Unread book in perfect condition.
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Testing Digital Circuits: An Introduction (Aspects of Information Technology S.)
Language: English
Published by Cengage Learning EMEA, 1986
ISBN 10: 0412383608 ISBN 13: 9780412383601
Condition: Good. Most items will be dispatched the same or the next working day. A copy that has been read but remains in clean condition. All of the pages are intact and the cover is intact and the spine may show signs of wear. The book may have minor markings which are not specifically mentioned.
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Measuring and Testing in Science and Technology: An Introduction
Language: English
Published by David & Charles 17/09/1970, 1970
ISBN 10: 0715349228 ISBN 13: 9780715349229
Hardcover. Condition: Very Good. Shipped within 24 hours from our UK warehouse. Clean, undamaged book with no damage to pages and minimal wear to the cover. Spine still tight, in very good condition. Remember if you are not happy, you are covered by our 100% money back guarantee.
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Technical Guide to Information Security Testing and Assessment : Recommendations of the National Institute of Standards and Technology
Language: English
Published by CreateSpace Independent Publishing Platform, 2008
ISBN 10: 1495435954 ISBN 13: 9781495435959
Condition: As New. Unread book in perfect condition.
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Semiconductor Memories : Technology, Testing, and Reliability
Language: English
Published by Wiley & Sons, Incorporated, John, 2002
ISBN 10: 0780310004 ISBN 13: 9780780310001
Condition: Good. Former library copy. Pages intact with minimal writing/highlighting. The binding may be loose and creased. Dust jackets/supplements are not included. Includes library markings. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.
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Semiconductor Measurement Technology : ARPA/NBS Workshop II. Hermeticity Testing for Integrated Circuits (NBS Special Publication 400-9).
Published by National Bureau of Standards., 1974
Soft cover. Condition: Very Good. ORIGINAL 1974 PUBLICATION; Softcover; in very good condition. Book.
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Paperback or Softback. Condition: New. Space Technology-5 Lithium-Ion Battery Design, Qualification and Integration and Testing. Book.
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Condition: New.
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Paperback or Softback. Condition: New. Fighting Testing ACAT/FRRP: Automatic Collision Avoidance Technology/Fighter Risk Reduction Project. Book.
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Paperback or Softback. Condition: New. Terrorism and Drug Trafficking: Testing Status and Views on Operational Viability of Pulsed Fast Neutron Analysis Technology. Book.
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Condition: New.
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Condition: As New. Unread book in perfect condition.
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Condition: Good. Most items will be dispatched the same or the next working day. A copy that has been read but remains in clean condition. All of the pages are intact and the cover is intact and the spine may show signs of wear. The book may have minor markings which are not specifically mentioned.
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Paperback or Softback. Condition: New. Gridley Ethanol Demonstration Project Utilizing Biomass Gasification Technology: Pilot Plant Gasifier and Syngas Conversion Testing. Book.
