Crystals, Defects and Microstructures: Modeling Across Scales.

Phillips, Rob:

ISBN 10: 0521793572 / ISBN 13: 9780521793575

Published by Cambridge University Press, 2001

About this Item

xxvi 780p large format paperback, a heavy tome, bright orange cover, spine tight, alost as new Language: English.

Seller Inventory # 232581

Bibliographic Details

• Title: Crystals, Defects and Microstructures: Modeling Across Scales.
• Publisher: Cambridge University Press
• Publication Date: 2001
• Language: English
• ISBN 10: 0521793572
• ISBN 13: 9780521793575
• Binding: Paperback
• Edition: 1st Edition
• Condition: Very Good
• Seller catalogs:
  • Mathematics

About this title

Synopsis

A central tenet of materials analysis is the structure-property paradigm, which proposes a direct connection between the geometric structures within a material and its properties. The increasing power of high-speed computation has had a major impact on theoretical materials science and has permitted the systematic examination of this connection between structure and properties. In this textbook, Rob Phillips examines various methods for studying crystals, defects, and microstructures, techniques that have made such computations possible. He also presents recent efforts to treat problems involving either multiple spatial or temporal scales simultaneously. Detailed case studies illustrate general principles as well as their applications to current research problems.

Book Description

Materials science has emerged as one of the central pillars of the modern physical sciences and engineering, and is now even beginning to claim a role in the biological sciences. A central tenet in the analysis of materials is the structure-property paradigm, which proposes a direct connection between the geometric structures within a material and its properties. The increasing power of high-speed computation has had a major impact on theoretical materials science and has permitted the systematic examination of this connection between structure and properties.