Design and Analysis of Accelerated Tests for Mission Critical Reliability.

LuValle, Michael J./LeFevre, Bruce G./Kannan, SirRaman

ISBN 10: 1584884711 ISBN 13: 9781584884712
Published by Chapman and Hall/CRC., 2004
Language: English
Condition: Used Hardcover

Sold by Universitätsbuchhandlung Herta Hold GmbH, Berlin, Germany

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