Digital Systems Testing and Testable Design

Abramovici, Miron; Breuer, Melvin A.; Friedman, Arthur D.

ISBN 10: 0716781794 / ISBN 13: 9780716781790

Published by Computer Science Press, 1990

About this Item

Previous owner's name, blacked out, on the front flyleaf, otherwise a near fine unmarked hardcover first edition copy in a slick blue binding, no DJ.

Seller Inventory # 027697

Bibliographic Details

• Title: Digital Systems Testing and Testable Design
• Publisher: Computer Science Press
• Publication Date: 1990
• Language: English
• ISBN 10: 0716781794
• ISBN 13: 9780716781790
• Binding: Hardcover
• Edition: First Edition
• Condition: Near Fine
• Dust Jacket Condition: No Jacket

About this title

Synopsis

Modeling, logic simulation, fault modeling, fault simulation, testing for single stuck faults, testing for bridging faults, functioning testing, design for test ability, compression techniques, built-in self test, logic-level diagnosis, self-checking design, PLA testing, system-level diagnosis.

From the Back Cover

This widely-used textbook provides comprehensive, state-of-the-art coverage of digital systems testing and testable design.

Considered a definitive text in this area, the book includes in-depth discussions of the following topics:

Test generation
Fault modeling for classic and new technologies
Simulation
Fault simulation
Design for testability
Built-in self-test Diagnosis

All topics are covered extensively, from fundamental concepts to advanced techniques.

Successfully used world-wide at leading universities, the book is appropriate for graduate-level and senior-level undergraduate courses. Numerous examples and problems help make the learning process easier for the reader. Test engineers, ASIC and system designers, and CAD developers will find it an invaluable tool to keep current with recent changes in the field.