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Methods of Measurement for Semiconductor Materials, Process Control, and Divices: Quarterly Report, January 1 to March 31, 1970 (Classic Reprint) - Hardcover
Synopsis
This book explores the history, present day methods, and future direction of measuring semiconductor materials, process control, and devices. It elucidates the underlying principles of measuring techniques used in the semiconductor industry, providing insight into their strengths and weaknesses. The author examines the evolution of these techniques, tracing the development of new approaches and standards. This book explores the latest research related to specific measurement methods, offering timely insights into the direction of the field. It is an essential read for those seeking a comprehensive understanding of semiconductor measurement techniques and their role in the advancement of the industry.
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Methods of Measurement for Semiconductor Materials, Process Control, and Divices: Quarterly Report, January 1 to March 31, 1970 (Classic Reprint)
Seller: PBShop.store US, Wood Dale, IL, U.S.A.
Seller rating 5 out of 5 stars
HRD. Condition: New. New Book. Shipped from UK. Established seller since 2000. Seller Inventory # LX-9780260749659
Quantity: 15 available
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Methods of Measurement for Semiconductor Materials, Process Control, and Divices: Quarterly Report, January 1 to March 31, 1970 (Classic Reprint)
Seller: PBShop.store UK, Fairford, GLOS, United Kingdom
Seller rating 5 out of 5 stars
HRD. Condition: New. New Book. Shipped from UK. Established seller since 2000. Seller Inventory # LX-9780260749659
Quantity: 15 available