Methods of Measurement for Semiconductor Materials, Process Control, and Divices: Quarterly Report, January 1 to March 31, 1970 (Classic Reprint) - Hardcover

W. Murray Bullis

 
9780260749659: Methods of Measurement for Semiconductor Materials, Process Control, and Divices: Quarterly Report, January 1 to March 31, 1970 (Classic Reprint)
Hardcover
ISBN 10: 0260749656 ISBN 13: 9780260749659
Publisher: Forgotten Books, 2018

Synopsis

This book explores the history, present day methods, and future direction of measuring semiconductor materials, process control, and devices. It elucidates the underlying principles of measuring techniques used in the semiconductor industry, providing insight into their strengths and weaknesses. The author examines the evolution of these techniques, tracing the development of new approaches and standards. This book explores the latest research related to specific measurement methods, offering timely insights into the direction of the field. It is an essential read for those seeking a comprehensive understanding of semiconductor measurement techniques and their role in the advancement of the industry.

"synopsis" may belong to another edition of this title.

Publisher
Forgotten Books
Publication date
2018
Language
English
ISBN 10 
0260749656
ISBN 13 
9780260749659
Binding
Hardcover
Number of pages
70

Other Popular Editions of the Same Title

9780266782988: Methods of Measurement for Semiconductor Materials, Process Control, and Divices: Quarterly Report, January 1 to March 31, 1970 (Classic Reprint)

Featured Edition

ISBN 10:  0266782981 ISBN 13:  9780266782988
Publisher: Forgotten Books, 2018
Softcover