Synopsis
A practical Fortran program for ellipsometer data analysis
Discover a general Fortran program designed to analyze ellipsometer measurements. This edition updates a prior version and runs in Fortran IV and V, with enhancements that improve accuracy and usability.
The book explains how the program computes optical properties from ellipsometer readings, including handling wave plate transmissions, calculating tilt corrections, and deriving thickness and refractive index for films on a surface. It also shows how to input data via punched cards, control data flow with specific instructions, and generate results that include confidence limits and adsorbed-film constants.What you will experience
- Step-by-step guidance on using the program to analyze film-covered surfaces
- How to account for instrumental factors like wave plate transmission and tilt
- Methods for obtaining refractive indices, film thicknesses, and optical constants
- Examples of data input, program structure, and interpretation of results
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A Fortran Program for Analysis of Ellipsometer Measurements (Classic Reprint)
Seller: PBShop.store US, Wood Dale, IL, U.S.A.
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HRD. Condition: New. New Book. Shipped from UK. Established seller since 2000. Seller Inventory # LX-9780265878248
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A Fortran Program for Analysis of Ellipsometer Measurements (Classic Reprint)
Seller: PBShop.store UK, Fairford, GLOS, United Kingdom
Seller rating 5 out of 5 stars
HRD. Condition: New. New Book. Shipped from UK. Established seller since 2000. Seller Inventory # LX-9780265878248
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