Ellipsometry in the Measurement of Surfaces and Thin Films: Symposium Proceedings, Washington 1963; Symposium Held September 5-6, 1963, at the National Bureau of Standards, Washington, D. C (Classic R - Hardcover

E. Passaglia

9780266786931: Ellipsometry in the Measurement of Surfaces and Thin Films: Symposium Proceedings, Washington 1963; Symposium Held September 5-6, 1963, at the National Bureau of Standards, Washington, D. C (Classic R

Hardcover

ISBN 10: 0266786936 ISBN 13: 9780266786931

Publisher: Forgotten Books, 2018

View all copies of this ISBN edition

0 Used

2 New

From US$ 46.74

A concise, field-defining collection on ellipsometry for surfaces and thin films.

This volume gathers 20 technical papers from a 1963 symposium, offering both historical context and cutting-edge methods in a single, self-contained reference.

Learn how ellipsometry measures film thickness and optical constants, and how exact Drude-based equations are applied with modern computing.
Explore techniques for oxide films, metal surfaces, and adsorption phenomena, including in situ and aqueous environments.
Review instrumentation advances, computation approaches, and practical applications in metallurgy, corrosion, and solid-state electronics.
See theoretical developments, experimental sensitivity considerations, and diverse data interpretations through real-world examples.

Ideal for researchers and technicians beginning or advancing work in surface science, thin films, and optical characterization. This edition is a solid foundation for understanding the state of the art and its applications in industry and academia.

"synopsis" may belong to another edition of this title.