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Synopsis
The proceedings of the combined First Pacific-International Congress on X-Ray Analytical Methods (PICXAM) and Fortieth Annual Conference on Applications of X-Ray Analysis, held in Hilo and Honolulu Hawaii, August 1991, comprise reports on the latest developments in international research on X-ray fluorescence and X-ray diffraction techniques. For scientists and technicians in materials science, applied spectroscopy, instrumentation, and all aspects of X-ray techniques. Annotation copyright Book News, Inc. Portland, Or.
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Advances in X-Ray Analysis, Vol. 35A and 35B
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Advances In X - Ray Analysis
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Advances In X-ray Analysis
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Advances In X-ray Analysis
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Advances in X-Ray Analysis
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Advances in X-Ray Analysis
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Advances in X-Ray Analysis
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Advances in X-Ray Analysis, Vol. 35
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Advances in X-Ray Analysis
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Gebunden. Condition: New. Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrument. Seller Inventory # 897687730
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Advances in X-Ray Analysis, Vol. 35
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