Order Total (1 Item Items):
Shipping Destination:
Predecki Paul (83 results)
Skip to main search results
Search filters
Product Type
- All Product Types
- Books (81)
- Magazines & Periodicals (2)
- Comics (No further results match this refinement)
- Sheet Music (No further results match this refinement)
- Art, Prints & Posters (No further results match this refinement)
- Photographs (No further results match this refinement)
- Maps (No further results match this refinement)
- Manuscripts & Paper Collectibles (No further results match this refinement)
Condition Learn more
- New (71)
- As New, Fine or Near Fine (8)
- Very Good or Good (4)
- Fair or Poor (No further results match this refinement)
- As Described (No further results match this refinement)
Binding
Collectible Attributes
- First Edition (4)
- Signed (No further results match this refinement)
- Dust Jacket (4)
- Seller-Supplied Images (31)
- Not Print on Demand (52)
Language (2)
Free Shipping
Seller Location
Seller Rating
-
Advances in X-Ray Analysis, Vol. 29
First Edition
Hardcover. Condition: Fine. Dust Jacket Condition: Fine. First Edition. Previous owner's blindstamp, otherwise a fine hardcover copy in a fine mylar protected DJ, white spine.
-
OBSERVATIONS OF DEFORMATION IN SPHERULITIC POLYETHYLENE (Pamphlet)
Published by J Applied Physics, 1970
Magazine / Periodical
Pamphlet. Condition: Very Good. Vol 41, No 11, pp. 4342-4346, Illus, 4to, Extracted from orig vol, begins with title page, trimmed & stapled, thus is like a pamphlet, else VG.
-
DISLOCATIONS CAUSED BY CHAIN ENDS IN CRYSTALLINE POLYMERS (Pamphlet)
Published by J Applied Physics, 1966
Magazine / Periodical
Pamphlet. Condition: Very Good. Vol 37, No 11, pp. 4053-4059, Illus, 4to, Extracted from orig vol, begins with title page, trimmed & stapled, thus is like a pamphlet else VG.
-
Advances in X-Ray Analysis, Vol. 31
First Edition
Hardcover. Condition: Fine. Dust Jacket Condition: Fine. First Edition. This is a fine hardcover copy in a fine mylar protected DJ, white spine.
-
Advances in X-Ray Analysis, Vol. 30
First Edition
Hardcover. Condition: Fine. Dust Jacket Condition: Fine. First Edition. This is a fine hardcover copy in a fine mylar protected DJ, white spine.
-
Advances in X-Ray Analysis, Vol. 27
First Edition
Hardcover. Condition: Fine. Dust Jacket Condition: Fine. First Edition. Previous owner's blindstamp, otherwise a fine hardcover copy in a fine mylar protected DJ, white spine.
-
Advances in X-Ray Analysis, Vol. 35A and 35B
Seller: Zubal-Books, Since 1961, Cleveland, OH, U.S.A.
Seller rating 5 out of 5 stars
Condition: Good. *Price HAS BEEN REDUCED by 10% until Monday, June 8 (weekend SALE item)* 2 Volumes, 1334 pp., hardcover, ex library, else text and bindings clean and tight. - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country.
-
Condition: New. pp. 1334.
-
Condition: New. pp. 1334 1st Edition.
-
Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
-
Condition: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
-
Condition: New. pp. 1334.
-
Advances in X-Ray Analysis: Volume 28
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 69.80
US$ 15.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
-
Advances in X-Ray Analysis: Volume 35B
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 69.80
US$ 15.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
-
US$ 65.86
US$ 20.66 shipping
Ships from United Kingdom to U.S.A.Quantity: 10 available
Add to basketPF. Condition: New.
-
US$ 66.21
US$ 20.66 shipping
Ships from United Kingdom to U.S.A.Quantity: 10 available
Add to basketPF. Condition: New.
-
Condition: New. Brand New, Softcover edition. This item may ship from the US or our Overseas warehouse depending on your location and stock availability.
-
Condition: New. pp. 412 Index.
-
Condition: New. pp. 932 68:B&W 7 x 10 in or 254 x 178 mm Case Laminate on White w/Gloss Lam.
-
Condition: New. pp. 648.
-
Condition: New. pp. 932.
-
Advances in X-Ray Analysis, Vol. 38
Seller: Zubal-Books, Since 1961, Cleveland, OH, U.S.A.
Seller rating 5 out of 5 stars
Condition: Very Good. *Price HAS BEEN REDUCED by 10% until Monday, June 8 (weekend SALE item)* 813 pp., hardcover, minor library markings else text clean & binding tight (lacks dust jacket). - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country. Photos available upon request.
-
Condition: New. pp. 932.
-
International EditionUS$ 110.82
US$ 7.99 shipping
Ships from United Kingdom to U.S.A.Quantity: 8 available
Add to basketCondition: New. Brand New ! Fast Delivery "International Edition " and ship within 24-48 hours. Deliver by FedEx and Dhl, & Aramex, UPS, & USPS and we do accept APO and PO BOX Addresses. Order can be delivered worldwide within 4-6 Working days .and we do have flat rate for up to 2LB. Extra shipping charges will be requested This Item May be shipped from India, United states & United Kingdom. Depending on your location and availability.
-
Advances in X-Ray Analysis, Vol. 35
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 117.30
US$ 15.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
-
Taschenbuch. Condition: Neu. Advances in X-Ray Analysis | Volume 28 | Paul K. Predecki (u. a.) | Taschenbuch | Einband - flex.(Paperback) | Englisch | 2011 | Springer US | EAN 9781461294993 | Verantwortliche Person für die EU: Springer Heidelberg, Tiergartenstr. 17, 69121 Heidelberg, buchhandel-buch[at]springer[dot]com | Anbieter: preigu.
-
Taschenbuch. Condition: Neu. Advances in X-Ray Analysis | Volume 35B | C. S. Barrett (u. a.) | Taschenbuch | iv | Englisch | 2012 | Springer | EAN 9781461365327 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
-
Advances in X-Ray Analysis : Volume 28
Language: English
Published by Springer US, Springer New York, 2011
ISBN 10: 1461294991 ISBN 13: 9781461294993
Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - The 33rd Annual Denver Conference on Applications of X-Ray Analysis was held July 30-August 3. 1984. on the campus of the University of Denver. Following the recent tradition of alternating plenary lecture topics between X-ray diffraction and X-ray fluorescence at the confer ence. the plenary sessions dealt with topics of X-ray fluorescence. Prof. H. Aiginger presented a plenary lect~re on TOTAL REFLECTANCE X-RAY SPECTROMETRY which admirably described this relatively new technique. J. C. Russ discussed XRF AND OTHER SURFACE ANALYTICAL TECHNIQUES which gave an excellent overview of the role XRF plays in a modern analytical laboratory. J. E. Taggart. Jr. described THE ROLE OF XRF IN A MODERN GEOCHEMICAL LABORATORY and presented many case histories of the configura tion of analytical equipment in several geochemical laboratories. The plenary lectures demonstrated both the dynamic nature of research in X-ray fluorescence. and the important role X-ray spectrom etry plays in the arsenal of analytical methods found in modern labora tories. Total reflectance X-ray spectrometry takes advantage of con sideration of the geometry of the X-ray optics. Potentially. new sample types may be considered as X-ray fluorescence specimens using this technique.
-
Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrumentation, Techniques, and Reference Materials. Stress Determination by Diffraction Methods. XRD Profile Fitting, Crystallite Size and Strain Determination. XRD Applications: Detection Limits, Superconductors, Organics, Minerals. Mathematical Methods in XRay Spectrometry (XRS). Thin Film and Surface Characterization by XRS and XPS. Total Reflection XRS. XRS Techniques and Instrumentation. XRS Applications. XRay Imaging and Tomography. 161 articles. Index.
-
US$ 127.79
US$ 33.35 shipping
Ships from United Kingdom to U.S.A.Quantity: 1 available
Add to basketPaperback. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
