Paul K Predecki (90 results)

Advances in X-Ray Analysis, Vol. 29
Barrett, Charles S. & Paul K. Predecki & Donald E. Leyden, John C. Russ & John Faber, Jr., & Ron Jenkins, Editors
- Hardcover
- First Edition
Seller: Reader's Corner, Inc., Raleigh, NC, U.S.A.Reader's Corner, Inc.
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Hardcover. Condition: Fine. Dust Jacket Condition: Fine. First Edition. Previous owner's blindstamp, otherwise a fine hardcover copy in a fine mylar protected DJ, white spine.

Advances in X-Ray Analysis, Vol. 31
Barrett, Charles S. & Paul K. Predecki & Donald E. Leyden, John C. Russ & Ron Jenkins & John V. Gilfrich,, Editors
- Hardcover
- First Edition
Seller: Reader's Corner, Inc., Raleigh, NC, U.S.A.Reader's Corner, Inc.
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US$ 25.00
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Hardcover. Condition: Fine. Dust Jacket Condition: Fine. First Edition. This is a fine hardcover copy in a fine mylar protected DJ, white spine.

Advances in X-Ray Analysis, Vol. 30
Barrett, Charles S. & Paul K. Predecki & Donald E. Leyden, John C. Russ & Ron Jenkins & John V. Gilfrich,, Editors
- Hardcover
- First Edition
Seller: Reader's Corner, Inc., Raleigh, NC, U.S.A.Reader's Corner, Inc.
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Hardcover. Condition: Fine. Dust Jacket Condition: Fine. First Edition. This is a fine hardcover copy in a fine mylar protected DJ, white spine.

- Hardcover
Seller: BookDepart, Shepherdstown, WV, U.S.A.BookDepart
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Hardcover. Condition: Very Good. Hardcover; Volume 32 only; proceedings of the 37th annual conference on App lications of X-Ray Analysis, held August 1-5, 1988, in Steamboat Springs, C olorado; light fading and shelf wear to exterior; former owner's stamping o n front endpaper; a few small spots at top page edge; in very good co…nditio n with clean text, firm binding. Dust jacket shows light scuffing and shelf wear.

- Hardcover
Seller: BookDepart, Shepherdstown, WV, U.S.A.BookDepart
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Hardcover. Condition: Very Good. Hardcover; Volume 29 only; proceedings of the 34th annual conference on App lications of X-Ray Analysis, held August 5-9, 1985, in Snowmass, Colorado; light fading and shelf wear to exterior; light stain at top page corners; f ade spots to endpapers; in very good condition with clean text, firm b…indin g. Dust jacket shows scuffing, light soiling, and a few small edge tears.

Advances in X-Ray Analysis, Vol. 27
Barrett, Charles S. & Paul K. Predecki & Donald E. Leyden & John C. Russ & Jerome B. Cohen, Editors
- Hardcover
- First Edition
Seller: Reader's Corner, Inc., Raleigh, NC, U.S.A.Reader's Corner, Inc.
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Hardcover. Condition: Fine. Dust Jacket Condition: Fine. First Edition. Previous owner's blindstamp, otherwise a fine hardcover copy in a fine mylar protected DJ, white spine.

- Hardcover
Seller: Romtrade Corp., STERLING HEIGHTS, MI, U.S.A.Romtrade Corp.
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Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

- Hardcover
Seller: Basi6 International, Irving, TX, U.S.A.Basi6 International
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Condition: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.

- Hardcover
Seller: Zubal-Books, Since 1961, Cleveland, OH, U.S.A.Zubal-Books, Since 1961
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Condition: Good. 2 Volumes, 1334 pp., hardcover, ex library, else text and bindings clean and tight. - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's countr…y.

- Hardcover
Seller: SMASS Sellers, IRVING, TX, U.S.A.SMASS Sellers
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Condition: New. Brand New Original US Edition. Customer service! Satisfaction Guaranteed.

- Softcover
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- Hardcover
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Condition: New. pp. 1334.

- Softcover
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- Hardcover
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Condition: New. pp. 1334 1st Edition.

- Softcover
Seller: Chiron Media, Wallingford, United KingdomChiron Media
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PF. Condition: New.

- Softcover
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PF. Condition: New.

- Hardcover
Seller: Biblios, frankfurt am main, HESSE, GermanyBiblios
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Condition: New. pp. 1334.

- Softcover
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Condition: New. pp. 412 Index.

- Softcover
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- Softcover
- International Edition
Seller: Romtrade Corp., STERLING HEIGHTS, MI, U.S.A.Romtrade Corp.
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Condition: New. Brand New. Soft Cover International Edition. Different ISBN and Cover Image. Priced lower than the standard editions which is usually intended to make them more affordable for students abroad. The core content of the book is generally the same as the standard edition. The country selling restrictions may be print…ed on the book but is no problem for the self-use. This Item maybe shipped from US or any other country as we have multiple locations worldwide.

- Hardcover
Seller: Basi6 International, Irving, TX, U.S.A.Basi6 International
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Condition: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.

- Softcover
Seller: SMASS Sellers, IRVING, TX, U.S.A.SMASS Sellers
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Condition: New. Brand New, Softcover edition. This item may ship from the US or our Overseas warehouse depending on your location and stock availability.

- Hardcover
Seller: Zubal-Books, Since 1961, Cleveland, OH, U.S.A.Zubal-Books, Since 1961
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Condition: Very Good. 813 pp., hardcover, minor library markings else text clean & binding tight (lacks dust jacket). - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by r…ecipient's country. Photos available upon request.

- Hardcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
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Condition: New. In.
More images- Softcover
Seller: preigu, Osnabrück, Germanypreigu
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Taschenbuch. Condition: Neu. Advances in X-Ray Analysis | Volume 35B | C. S. Barrett (u. a.) | Taschenbuch | iv | Englisch | 2012 | Springer | EAN 9781461365327 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.

- Hardcover
Seller: Majestic Books, Hounslow, United KingdomMajestic Books
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Condition: New. pp. 932 68:B&W 7 x 10 in or 254 x 178 mm Case Laminate on White w/Gloss Lam.

- Hardcover
Seller: Books Puddle, New York, NY, U.S.A.Books Puddle
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Condition: New. pp. 932.

- Hardcover
- International Edition
Seller: UK BOOKS STORE, London, LONDO, United KingdomUK BOOKS STORE
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Condition: New. Brand New! Fast Delivery This is an International Edition and ship within 24-48 hours. Deliver by FedEx and Dhl, & Aramex, UPS, & USPS and we do accept APO and PO BOX Addresses. Order can be delivered worldwide within 6-10 days and we do have flat rate for up to 2LB. Extra shipping charges will be requested if th…e Book weight is more than 5 LB. This Item May be shipped from India, United states & United Kingdom. Depending on your location and availability.

- Softcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - The 33rd Annual Denver Conference on Applications of X-Ray Analysis was held July 30-August 3. 1984. on the campus of the University of Denver. Following the recent tradition of alternating plenary lecture topics between X-ray diffraction and X-ray… fluorescence at the confer ence. the plenary sessions dealt with topics of X-ray fluorescence. Prof. H. Aiginger presented a plenary lect~re on TOTAL REFLECTANCE X-RAY SPECTROMETRY which admirably described this relatively new technique. J. C. Russ discussed XRF AND OTHER SURFACE ANALYTICAL TECHNIQUES which gave an excellent overview of the role XRF plays in a modern analytical laboratory. J. E. Taggart. Jr. described THE ROLE OF XRF IN A MODERN GEOCHEMICAL LABORATORY and presented many case histories of the configura tion of analytical equipment in several geochemical laboratories. The plenary lectures demonstrated both the dynamic nature of research in X-ray fluorescence. and the important role X-ray spectrom etry plays in the arsenal of analytical methods found in modern labora tories. Total reflectance X-ray spectrometry takes advantage of con sideration of the geometry of the X-ray optics. Potentially. new sample types may be considered as X-ray fluorescence specimens using this technique.

- Softcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD I…nstrumentation, Techniques, and Reference Materials. Stress Determination by Diffraction Methods. XRD Profile Fitting, Crystallite Size and Strain Determination. XRD Applications: Detection Limits, Superconductors, Organics, Minerals. Mathematical Methods in XRay Spectrometry (XRS). Thin Film and Surface Characterization by XRS and XPS. Total Reflection XRS. XRS Techniques and Instrumentation. XRS Applications. XRay Imaging and Tomography. 161 articles. Index.