Paul K Predecki (70 results)

Hardcover. Condition: Fine. Dust Jacket Condition: Fine. First Edition. Previous owner's blindstamp, otherwise a fine hardcover copy in a fine mylar protected DJ, white spine.

Hardcover. Condition: Fine. Dust Jacket Condition: Fine. First Edition. This is a fine hardcover copy in a fine mylar protected DJ, white spine.

Hardcover. Condition: Fine. Dust Jacket Condition: Fine. First Edition. This is a fine hardcover copy in a fine mylar protected DJ, white spine.

Hardcover. Condition: Very Good. Hardcover; Volume 32 only; proceedings of the 37th annual conference on App lications of X-Ray Analysis, held August 1-5, 1988, in Steamboat Springs, C olorado; light fading and shelf wear to exterior; former owner's stamping o n front endpaper; a few small spots at top page edge; in very good conditio n with clean text, firm binding. Dust jacket shows light scuffing and shelf wear.…

Hardcover. Condition: Very Good. Hardcover; Volume 29 only; proceedings of the 34th annual conference on App lications of X-Ray Analysis, held August 5-9, 1985, in Snowmass, Colorado; light fading and shelf wear to exterior; light stain at top page corners; f ade spots to endpapers; in very good condition with clean text, firm bindin g. Dust jacket shows scuffing, light soiling, and a few small edge tears.…

Hardcover. Condition: Fine. Dust Jacket Condition: Fine. First Edition. Previous owner's blindstamp, otherwise a fine hardcover copy in a fine mylar protected DJ, white spine.

Condition: New. pp. 412 Index.

Condition: New. pp. 648.

Condition: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.

Condition: New. Brand New. Soft Cover International Edition. Different ISBN and Cover Image. Priced lower than the standard editions which is usually intended to make them more affordable for students abroad. The core content of the book is generally the same as the standard edition. The country selling restrictions may be printed on the book but is no problem for the self-use. This Item maybe shipped from US or any other country as we have multiple locations worldwide.…

Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrumentation, Techniques, and Reference Materials. Stress Determination by Diffraction Methods. XRD Profile Fitting, Crystallite Size and Strain Determination. XRD Applications: Detection Limits, Superconductors, Organics, Minerals. Mathematical Methods in XRay Spectrometry (XRS). Thin Film and Surface Characterization by XRS and XPS. Total Reflection XRS. XRS Techniques and Instrumentation. XRS Applications. XRay Imaging and Tomography. 161 articles. Index. …

Condition: New. Brand New! Fast Delivery This is an International Edition and ship within 24-48 hours. Deliver by FedEx and Dhl, & Aramex, UPS, & USPS and we do accept APO and PO BOX Addresses. Order can be delivered worldwide within 6-10 days and we do have flat rate for up to 2LB. Extra shipping charges will be requested if the Book weight is more than 5 LB. This Item May be shipped from India, United states & United Kingdom. Depending on your location and availability.…

Condition: New. pp. 932.

Condition: New. pp. 932 68:B&W 7 x 10 in or 254 x 178 mm Case Laminate on White w/Gloss Lam.

Condition: New. pp. 932.

Gebunden. Condition: New. Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrument.

Condition: Very Good. *Price HAS BEEN REDUCED by 10% until Monday, Nov 2 (SALE item)* 813 pp., hardcover, minor library markings else text clean & binding tight (lacks dust jacket). - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country. Photos available upon request.…

Paperback. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Hardcover. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Taschenbuch. Condition: Neu. Advances in X-Ray Analysis | Volume 32 | Charles S. Barrett (u. a.) | Taschenbuch | xxvi | Englisch | 2013 | Springer | EAN 9781475791129 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. …

Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - The 37th Annual Denver Conference on Applications of X-Ray Analysis was held August 1-5, 1988, at the Sheraton Steamboat Resort and Conference Center, Steamboat Springs, Colorado. As usual, alternating with x-ray diffraction, the emphasis this year was x-ray fluorescence, but as has been the pattern for several occasions over the last few years, the Plenary Session did not deal with that subject, specifically. In an attempt to introduce the audience to one of the new developments in x-ray analysis, the title of the session was 'High Brilliance Sources/Applications,' and dealt exclusively with synchrotron radiation, a topic which has made a very large impact on the x-ray community over the last decade. As the organizer and co-chairman of the Plenary Session (with Paul Predecki), it is my responsibility to report on that session here. The Conference had the privilege of obtaining the services of some of the preeminent practitioners of research using this remarkable x-ray source; they presented the audience with unusually lucid descriptions of the work which has been accomplished in the development and application of the continuous, high intensity, tunable, polarized and collimated x-rays available from no facility other than these specialized storage rings. The opening lecture (and I use that term intentionally) was an enthusiastic description of 'What is Synchrotron Radiation ' by Professor Boris Batterman of Cornell University and the Cornell High Energy Synchrotron Sourc(! (CHESS). …

Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - The 37th Annual Denver Conference on Applications of X-Ray Analysis was held August 1-5, 1988, at the Sheraton Steamboat Resort and Conference Center, Steamboat Springs, Colorado. As usual, alternating with x-ray diffraction, the emphasis this year was x-ray fluorescence, but as has been the pattern for several occasions over the last few years, the Plenary Session did not deal with that subject, specifically. In an attempt to introduce the audience to one of the new developments in x-ray analysis, the title of the session was 'High Brilliance Sources/Applications,' and dealt exclusively with synchrotron radiation, a topic which has made a very large impact on the x-ray community over the last decade. As the organizer and co-chairman of the Plenary Session (with Paul Predecki), it is my responsibility to report on that session here. The Conference had the privilege of obtaining the services of some of the preeminent practitioners of research using this remarkable x-ray source; they presented the audience with unusually lucid descriptions of the work which has been accomplished in the development and application of the continuous, high intensity, tunable, polarized and collimated x-rays available from no facility other than these specialized storage rings. The opening lecture (and I use that term intentionally) was an enthusiastic description of 'What is Synchrotron Radiation ' by Professor Boris Batterman of Cornell University and the Cornell High Energy Synchrotron Sourc(! (CHESS).…

Condition: New. pp. 624.

Condition: New. pp. 708.

Paperback. Condition: Brand New. reprint edition. 708 pages. 10.00x7.01x1.60 inches. In Stock.

Condition: New. pp. 712.

Gebunden. Condition: New. The 43rd Annual Conference on Applications ofX-ray Analysis was held August 1-5, 1994, at the Sheraton Steamboat Resort & Conference Center in Steamboat Springs, Colorado. The Denver X-Ray Conference has evolved from the 1950 s into an international forum f.

Gebunden. Condition: New. Proceedings of the Forty-fourth Annual Conference on Applications of X-Ray Analysis held in Colorado, Springs, Colorado, July 31-August 4, 1995 The 39th Denver Conference on Applications of X-ray Analysis was held July 31-August 4, 1995, at the Sherat.

Paperback. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Hardcover. Condition: Brand New. 787 pages. 10.25x7.00x1.75 inches. In Stock.