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Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report, July 1 to September 30, 1968 (Classic Reprint) - Softcover
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Excerpt from Methods of Measurement for Semiconductor Materials, Process Control, and Devices<br/><br/>Through long contact with the semiconductor industry, the Electronic Technology Division of the National Bureau of Standards has gathered substantial evidence of the need for improved measurement methods and standards for semiconductor materials characterization, for process con trol, and for device characterization. These methods and standards are needed for satisfactory buyer-seller exchanges, for economy in govern ment purchasing, and for improved product uniformity, interchangeability, and reliability. The need is recognized both by industry and by govern ment. Nbs as a national center for measurement development, without vendor or user bias, and already competent in the field, has repeatedly been singled out as the uniquely appropriate organization to provide assistance in the resolution of these problems.
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Methods of Measurement for Semiconductor Materials, Process Control, and
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Paperback. Condition: New. Print on Demand. This book is a reproduction of an important historical work, digitally reconstructed using state-of-the-art technology to preserve the original format. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in the book. print-on-demand item. Seller Inventory # 9780364181515_0
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Methods of Measurement for Semiconductor Materials, Process Control, and Devices
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PAP. Condition: New. New Book. Shipped from UK. Established seller since 2000. Seller Inventory # LW-9780364181515
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Methods of Measurement for Semiconductor Materials, Process Control, and Devices
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PAP. Condition: New. New Book. Shipped from UK. Established seller since 2000. Seller Inventory # LW-9780364181515
Quantity: 15 available