Synopsis
Excerpt from Large Scale Integration Digital Testing<br/><br/>This annotated bibliography covers articles published in the field of semiconductor device testing. The bibliography contains (1) entries divided into six economics of testing, (2) monolithic circuit testing, (3) the testing of subsystems of large scale integrated circuits such as microcomputer boards and memory arrays, (4) various test strategies used to locate a defective lsi circuit, (5) test equipment available for lsi testing, and (6) various measurement methods that may be of interest to the test engineer. Key Words: Electronics; integrated circuit; large scale integration; memory; microprocessor; testing.
"synopsis" may belong to another edition of this title.
Other Popular Editions of the Same Title
Search results for Large Scale Integration Digital Testing
Stock Image
Large Scale Integration Digital Testing Annotated Bibliography, 19691978 Classic Reprint
Seller: PBShop.store US, Wood Dale, IL, U.S.A.
Seller rating 5 out of 5 stars
HRD. Condition: New. New Book. Shipped from UK. Established seller since 2000. Seller Inventory # LX-9780364995747
Stock Image
Large Scale Integration Digital Testing Annotated Bibliography, 19691978 Classic Reprint
Seller: PBShop.store UK, Fairford, GLOS, United Kingdom
Seller rating 5 out of 5 stars
HRD. Condition: New. New Book. Shipped from UK. Established seller since 2000. Seller Inventory # LX-9780364995747
Buy New
US$ 37.73
US$ 5.55 shipping
Ships from United Kingdom to U.S.A.
Ships from United Kingdom to U.S.A.
Quantity: 15 available