Synopsis
This book presents a detailed study of how defects in semiconductor materials and devices affect the performance, interchangeability, and reliability of discrete semiconductor devices and integrated circuits. The author explores established measurement methods while seeking to improve existing techniques and create new ones for the more reliable detection of defects that may lead to device failure. By focusing on the electrical properties of bulk silicon wafers, and the characterization of generation-recombination-trapping centers in silicon, the text provides valuable insights into controlling device fabrication. The author also examines gold-doped silicon and the use of infrared methods for detecting and counting impurity and defect centers in semiconductors, offering a comprehensive study from materials to methods. This book is an essential resource for professionals and researchers in the semiconductor industry, providing a deeper understanding of the factors influencing device performance and the techniques used to ensure reliability.
"synopsis" may belong to another edition of this title.
Other Popular Editions of the Same Title
Search results for Methods of Measurement for Semiconductor Materials,...
Seller Image
Methods of Measurement for Semiconductor Materials, Process Control, and
Print on DemandSeller: Forgotten Books, London, United Kingdom
Seller rating 4 out of 5 stars
Paperback. Condition: New. Print on Demand. This book presents a detailed study of how defects in semiconductor materials and devices affect the performance, interchangeability, and reliability of discrete semiconductor devices and integrated circuits. The author explores established measurement methods while seeking to improve existing techniques and create new ones for the more reliable detection of defects that may lead to device failure. By focusing on the electrical properties of bulk silicon wafers, and the characterization of generation-recombination-trapping centers in silicon, the text provides valuable insights into controlling device fabrication. The author also examines gold-doped silicon and the use of infrared methods for detecting and counting impurity and defect centers in semiconductors, offering a comprehensive study from materials to methods. This book is an essential resource for professionals and researchers in the semiconductor industry, providing a deeper understanding of the factors influencing device performance and the techniques used to ensure reliability. This book is a reproduction of an important historical work, digitally reconstructed using state-of-the-art technology to preserve the original format. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in the book. print-on-demand item. Seller Inventory # 9780365536581_0
Buy New
US$ 17.70
Free Shipping
Ships from United Kingdom to U.S.A.
Ships from United Kingdom to U.S.A.
Quantity: Over 20 available
Stock Image
Methods of Measurement for Semiconductor Materials, Process Control, and Devices
Seller: PBShop.store US, Wood Dale, IL, U.S.A.
Seller rating 5 out of 5 stars
PAP. Condition: New. New Book. Shipped from UK. Established seller since 2000. Seller Inventory # LW-9780365536581
Stock Image
Methods of Measurement for Semiconductor Materials, Process Control, and Devices
Seller: PBShop.store UK, Fairford, GLOS, United Kingdom
Seller rating 5 out of 5 stars
PAP. Condition: New. New Book. Shipped from UK. Established seller since 2000. Seller Inventory # LW-9780365536581
Buy New
US$ 28.30
US$ 4.40 shipping
Ships from United Kingdom to U.S.A.
Ships from United Kingdom to U.S.A.
Quantity: 15 available