Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM

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9780387258003: Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM
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Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.

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Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction to the theory and current practice of electron microscopy for undergraduate students who want to acquire an appreciation of how basic principles of physics are utilized in an important area of applied science, and for graduate students and technologists who make use of electron microscopes. At the same time, this book will be equally valuable for university teachers and researchers who need a concise supplemental text that deals with the basic principles of microscopy.

About the Author:

Ray Egerton is Professor Emeritus of Physics at the University of Alberta and at Portland State University. He serves as the Physical Sciences Editor for Micron, The International Research and Review Journal for Microscopy.
Prof. Egerton has published 90 full papers in refereed journals and is the author of Electron Energy-Loss Spectroscopy in the Electron Microscope, (3rd Edition, 2011, Springer). His awards include the Presidential Science Award from the Microbeam Analysis Society, the Distinguished Scientist Award from the Microscopy Society of America, and the Frances Doane Award for service to the Microscopical Society of Canada. He is a fellow of the Royal Society of Canada.

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Other Popular Editions of the Same Title

9783319398761: Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM

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ISBN 10:  3319398768 ISBN 13:  9783319398761
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9781441938374: Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM

Springer, 2010
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Book Description Springer. Hardcover. Condition: New. 202 pages. Dimensions: 9.4in. x 6.3in. x 0.6in.Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and inner space. Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy. This item ships from multiple locations. Your book may arrive from Roseburg,OR, La Vergne,TN. Hardcover. Seller Inventory # 9780387258003

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Book Description Springer-Verlag New York Inc., United States, 2011. Hardback. Condition: New. 1st ed. 2005. Corr. 2nd printing 2011. Language: English. Brand new Book. Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy. Seller Inventory # APC9780387258003

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