Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM

0 avg rating
( 0 ratings by Goodreads )
 
9781441938374: Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM
View all copies of this ISBN edition:
 
 

Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.

"synopsis" may belong to another edition of this title.

From the Back Cover:

Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction to the theory and current practice of electron microscopy for undergraduate students who want to acquire an appreciation of how basic principles of physics are utilized in an important area of applied science, and for graduate students and technologists who make use of electron microscopes. At the same time, this book will be equally valuable for university teachers and researchers who need a concise supplemental text that deals with the basic principles of microscopy.

About the Author:

Ray Egerton is Professor Emeritus of Physics at the University of Alberta and at Portland State University. He serves as the Physical Sciences Editor for Micron, The International Research and Review Journal for Microscopy.
Prof. Egerton has published 90 full papers in refereed journals and is the author of Electron Energy-Loss Spectroscopy in the Electron Microscope, (3rd Edition, 2011, Springer). His awards include the Presidential Science Award from the Microbeam Analysis Society, the Distinguished Scientist Award from the Microscopy Society of America, and the Frances Doane Award for service to the Microscopical Society of Canada. He is a fellow of the Royal Society of Canada.

"About this title" may belong to another edition of this title.

Other Popular Editions of the Same Title

9783319398761: Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM

Featured Edition

ISBN 10:  3319398768 ISBN 13:  9783319398761
Publisher: Springer, 2016
Hardcover

9780387258003: Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM

Springer, 2011
Hardcover

Top Search Results from the AbeBooks Marketplace

1.

Egerton, R.F.
Published by Springer (2010)
ISBN 10: 1441938370 ISBN 13: 9781441938374
New Paperback Quantity Available: 2
Seller:
Murray Media
(North Miami Beach, FL, U.S.A.)
Rating
[?]

Book Description Springer, 2010. Paperback. Condition: New. Never used!. Seller Inventory # P111441938370

More information about this seller | Contact this seller

Buy New
US$ 327.50
Convert Currency

Add to Basket

Shipping: FREE
Within U.S.A.
Destination, Rates & Speeds

2.

R.F. Egerton
Published by Springer (2010)
ISBN 10: 1441938370 ISBN 13: 9781441938374
New Softcover Quantity Available: 1
Seller:
Irish Booksellers
(Portland, ME, U.S.A.)
Rating
[?]

Book Description Springer, 2010. Condition: New. book. Seller Inventory # M1441938370

More information about this seller | Contact this seller

Buy New
US$ 350.87
Convert Currency

Add to Basket

Shipping: FREE
Within U.S.A.
Destination, Rates & Speeds