Characterization of a High Frequency Probe Assembly for Integrated Circuit Measurements - Softcover

Ramon L. Jesch

9780428459154: Characterization of a High Frequency Probe Assembly for Integrated Circuit Measurements

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ISBN 10: 0428459153 ISBN 13: 9780428459154

Publisher: Forgotten Books, 2024

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Excerpt from Characterization of a High Frequency Probe Assembly for Integrated Circuit Measurements<br/><br/>The work performed during the period September 1972 to July 1973 was reported in nbs Special Publication 400-5, Semiconductor Measurement Technology: Measurement of Trans istor Scattering Parameters This special publication describes the results of the interlaboratory comparison of transistor S � parameter measurements and shows how the equiva lent circuit of the HF probe assemblies can be characterized by means of S-parameters using previously � described techniques.

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Publisher: Forgotten Books
Publication date: 2024
Language: English
ISBN 10: 0428459153
ISBN 13: 9780428459154
Binding: Paperback
Number of pages: 65

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Characterization of a High Frequency Probe Assembly for Integrated Circuit

Ramon L. Jesch, C. A. Hoer

Published by Forgotten Books, 2024

ISBN 10: 0428459153 ISBN 13: 9780428459154

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Paperback. Condition: New. Print on Demand. This book is a reproduction of an important historical work, digitally reconstructed using state-of-the-art technology to preserve the original format. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in the book. print-on-demand item. Seller Inventory # 9780428459154_0

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