Characterization of a High Frequency Probe Assembly for Integrated Circuit Measurements - Softcover

Ramon L. Jesch

 
9780428459154: Characterization of a High Frequency Probe Assembly for Integrated Circuit Measurements
Softcover
ISBN 10: 0428459153 ISBN 13: 9780428459154
Publisher: Forgotten Books, 2024

Synopsis

Excerpt from Characterization of a High Frequency Probe Assembly for Integrated Circuit Measurements<br/><br/>The work performed during the period September 1972 to July 1973 was reported in nbs Special Publication 400-5, Semiconductor Measurement Technology: Measurement of Trans istor Scattering Parameters This special publication describes the results of the interlaboratory comparison of transistor S  parameter measurements and shows how the equiva lent circuit of the HF probe assemblies can be characterized by means of S-parameters using previously  described techniques.

"synopsis" may belong to another edition of this title.

Publisher
Forgotten Books
Publication date
2024
Language
English
ISBN 10 
0428459153
ISBN 13 
9780428459154
Binding
Paperback
Number of pages
65

Other Popular Editions of the Same Title

9780428697082: Characterization of a High Frequency Probe Assembly for Integrated Circuit Measurements (Classic Reprint)

Featured Edition

ISBN 10:  0428697089 ISBN 13:  9780428697082
Publisher: Forgotten Books, 2018
Hardcover