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Defect Oriented Testing for CMOS Analog and Digital Circuits (Frontiers in Electronic Testing) - Hardcover
Synopsis
Defect-oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality, and many factors have contributed to their industrial acceptance. Traditional approaches of testing modern integrated circuits (ICs) have been found to be inadequate in terms of quality and economics of test. In a globally competitive semiconductor market-place, overall product quality and economics have become very important objectives. In addition, electronic systems are becoming increasingly complex, and demand components of the highest possible quality. Testing in general, and defect-oriented testing in particular, help in realizing these objectives.
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Defect Oriented Testing for CMOS Analog and Digital Circuits (Frontiers in Electronic Testing)
Seller: HPB-Emerald, Dallas, TX, U.S.A.
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hardcover. Condition: Very Good. Connecting readers with great books since 1972! Used books may not include companion materials, and may have some shelf wear or limited writing. We ship orders daily and Customer Service is our top priority! Seller Inventory # S_410334443
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Defect Oriented Testing for CMOS Analog and Digital Circuits (Frontiers in Electronic Testing)
Seller: HPB-Red, Dallas, TX, U.S.A.
Seller rating 5 out of 5 stars
Hardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority! Seller Inventory # S_346632716
Quantity: 1 available