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Defect Oriented Testing for CMOS Analog and Digital Circuits - Softcover

Sachdev, Manoj

 
9781475749274: Defect Oriented Testing for CMOS Analog and Digital Circuits
Softcover
ISBN 10: 1475749279 ISBN 13: 9781475749274
Publisher: Springer, 2013

This specific ISBN edition is currently not available.

Synopsis

Foreword. Prface. 1. Introduction. 2. Digital CMOS Fault Modeling and Inductive Fault Analysis. 3. Defects in Logic Circuits and Their Test Implications. 4. Testing Defects in Sequential Circuits. 5. Defect Oriented RAM Testing and Current Testable RAMs. 6. Testing Defects in Programmable Logic Circuits. 7. Defect Oriented Analog Testing. 8. Conclusion. Index.

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Publisher
Springer
Publication date
2013
Language
English
ISBN 10 
1475749279
ISBN 13 
9781475749274
Binding
Paperback
Number of pages
324

(No Available Copies)

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Other Popular Editions of the Same Title

9780792380832: Defect Oriented Testing for CMOS Analog and Digital Circuits (Frontiers in Electronic Testing)

Featured Edition

ISBN 10:  0792380835 ISBN 13:  9780792380832
Publisher: Springer, 1997
Hardcover