Sequential Screening in Semiconductor Manufacturing I: Exploiting Lot-to-Lot Variability (Classic Reprint) - Softcover

Jihong Ou

 
9781332281473: Sequential Screening in Semiconductor Manufacturing I: Exploiting Lot-to-Lot Variability (Classic Reprint)

Synopsis

This book is a rigorous exploration into the practical application of queueing theory to semiconductor manufacturing. It focuses primarily on wafer fabrication, describing the problems faced in the facility and the mathematical tools that can be used to optimize production. The book acknowledges that previous yield models have not accounted for yield variability and spatial dependence, and develops new models to incorporate these factors into screening strategies. The author uses lot and wafer-level data collected from multiple semiconductor fabrication facilities to verify that screening can indeed lead to increased revenue. Operations researchers, industrial engineers, and researchers in the semiconductor manufacturing industry should appreciate the theoretical advancements and practical insights presented here.

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