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Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents (NanoScience and Technology) - Softcover

 
9781441923066: Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents (NanoScience and Technology)
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Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Written in the style of a textbook, it explains from scratch the theory behind today’s simulation techniques and gives examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations used in today’s research, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the instrument's operation is changed by materials properties; theorists will understand how simulations can be directly compared to experimental data.

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  • PublisherSpringer
  • Publication date2010
  • ISBN 10 1441923063
  • ISBN 13 9781441923066
  • BindingPaperback
  • Edition number1
  • Number of pages296

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9780387400907: Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents (NanoScience and Technology)

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Book Description Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Scanning Probe Microscopyprovides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Written in the style of a textbook, it explains from scratch the theory behind today's simulation techniques and gives examples of theoretical conceptsthrough state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations used in today's research, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the instrument's operation is changed by materials properties; theorists will understand how simulations can be directly compared to experimental data. 296 pp. Englisch. Seller Inventory # 9781441923066

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Book Description Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Scanning Probe Microscopy&nbspprovides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Written in the style of a textbook, it explains from scrat. Seller Inventory # 4172831

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Book Description Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Scanning Probe Microscopy is a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Writing in a tutorial style, the authors explain from scratch the theory behind today's simulation techniques and give examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the materials properties influence the instrument's operation, and theorists will understand how simulations can be directly compared to experimental data.Key FeaturesServes as a comprehensive source of information for researchers, teachers, and students about the theory underlying the rapidly expanding field of scanning probe microscopyProvides a framework for linking scanning probe theory and simulations with experimental dataWritten in the style of a textbook with step-by-step examples of how theoretical concepts are used to generate state-of-the-art simulations. Seller Inventory # 9781441923066

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