Items related to Nanometer Technology Designs: High-Quality Delay Tests
Traditional at-speed test methods cannot guarantee high quality test results as they face many new challenges. Supply noise effects on chip performance, high test pattern volume, small delay defect test pattern generation, high cost of test implementation and application, and utilizing low-cost testers are among these challenges. This book discusses these challenges in detail and proposes new techniques and methodologies to improve the overall quality of the transition fault test.
"synopsis" may belong to another edition of this title.
From the Back Cover:
While adopting newer, better fabrication technologies provides higher integration and enhances performance, it also increases the types of manufacturing defects. With design size in millions of gates and working frequency in GHz, timing-related defects have become a high proportion of the total chip defects. For nanometer technology designs, the traditional test methods cannot ensure a high quality level of chips, and at-speed tests using path and transition delay fault model have become a requirement in technologies below 180nm.
Nanometer Technology Designs: High-Quality Delay Tests discusses these challenges in detail and proposes new techniques and methodologies to improve the overall quality of the delay test for nanotechnology designs. Topics covered include:
- At-speed test challenges for nanotechnology
- Low-cost tester-friendly design-for-test techniques
- Improving test quality of current at-speed test methods
- Functionally un-testable fault list generation and avoidance
- Timing-based ATPG for screening small delay faults
- Faster-than-at-speed test considering power supply noise
- Power supply noise tolerant at-speed test pattern generation and application
- Solutions for dealing with crosstalk and signal integrity issues
Nanometer Technology Designs: High-Quality Delay Tests is a reference for practicing engineers and researchers in both industry and academia who are interested in learning about and implementing the most-advanced methods in nanometer delay testing.
"About this title" may belong to another edition of this title.
- PublisherSpringer
- Publication date2011
- ISBN 10 1441945598
- ISBN 13 9781441945594
- BindingPaperback
- Number of pages299
Buy New
Learn more about this copy
US$ 111.47
Shipping:
FREE
Within U.S.A.
Top Search Results from the AbeBooks Marketplace
Seller Image
Nanometer Technology Designs: High-Quality Delay Tests by Ahmed, Nisar [Paperback ]
Seller:
Rating
Book Description Soft Cover. Condition: new. Seller Inventory # 9781441945594
Buy New
US$ 111.47
Convert currency
Stock Image
Nanometer Technology Designs: High-Quality Delay Tests
Published by
Springer
(2011)
ISBN 10: 1441945598
ISBN 13: 9781441945594
New
Softcover
Quantity: > 20
Seller:
Rating
Book Description Condition: New. Seller Inventory # ABLIING23Mar2411530296010
Buy New
US$ 116.18
Convert currency
Stock Image
Nanometer Technology Designs : High-Quality Delay Tests
Published by
Springer
(2011)
ISBN 10: 1441945598
ISBN 13: 9781441945594
New
Softcover
Quantity: > 20
Seller:
Rating
Book Description Condition: New. PRINT ON DEMAND Book; New; Fast Shipping from the UK. No. book. Seller Inventory # ria9781441945594_lsuk
Buy New
US$ 124.04
Convert currency
Seller Image
Nanometer Technology Designs
Published by
Springer US
(2011)
ISBN 10: 1441945598
ISBN 13: 9781441945594
New
Softcover
Quantity: > 20
Seller:
Rating
Book Description Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Identifies defects in traditional at-speed test methodsProposes new techniques and methodologes to improve the overall quality of transition fault testsIncludes discussion of the effects of IR-dropProvides an introduction to path del. Seller Inventory # 4174904
Buy New
US$ 101.95
Convert currency
Stock Image
Nanometer Technology Designs: High-Quality Delay Tests
Seller:
Rating
Book Description Paperback. Condition: Brand New. 300 pages. 9.25x6.10x0.68 inches. In Stock. Seller Inventory # x-1441945598
Buy New
US$ 146.66
Convert currency
Stock Image
Nanometer Technology Designs: High-Quality Delay Tests
Published by
Springer-Verlag New York Inc.
(2011)
ISBN 10: 1441945598
ISBN 13: 9781441945594
New
Paperback / softback
Quantity: > 20
Seller:
Rating
Book Description Paperback / softback. Condition: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days. Seller Inventory # C9781441945594
Buy New
US$ 148.59
Convert currency
Seller Image
Nanometer Technology Designs : High-Quality Delay Tests
Published by
Springer US
(2011)
ISBN 10: 1441945598
ISBN 13: 9781441945594
New
Taschenbuch
Quantity: 1
Seller:
Rating
Book Description Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Adopting new fabrication technologies not only provides higher integration and enhances performance, but also increases the types of manufacturing defects. With design size in millions of gates and working frequency in GHz timing-related defects havv become a high proportion of the total chip defects. For nanometer technology designs, the stuck-at fault test alone cannot ensure a high quality level of chips. At-speed tests using the transition fault model has become a requirement in technologies below 180nm.Traditional at-speed test methods cannot guarantee high quality test results as they face many new challenges. Supply noise (including IR-drop, ground bounce, and Ldi/dt) effects on chip performance, high test pattern volume, low fault/defect coverage, small delay defect test pattern generation, high cost of test implementation and application, and utilizing low-cost testers are among these challenges. This book discusses these challenges in detail and proposes new techniques and methodologies to improve the overall quality of the transition fault test. Seller Inventory # 9781441945594
Buy New
US$ 125.84
Convert currency
Seller Image
Nanometer Technology Designs
Published by
Springer US Dez 2011
(2011)
ISBN 10: 1441945598
ISBN 13: 9781441945594
New
Taschenbuch
Quantity: 2
Seller:
Rating
Book Description Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Traditional at-speed test methods cannot guarantee high quality test results as they face many new challenges. Supply noise effects on chip performance, high test pattern volume, small delay defect test pattern generation, high cost of test implementation and application, and utilizing low-cost testers are among these challenges. This book discusses these challenges in detail and proposes new techniques and methodologies to improve the overall quality of the transition fault test. 300 pp. Englisch. Seller Inventory # 9781441945594
Buy New
US$ 153.68
Convert currency