Book Description Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrumentation, Techniques, and Reference Materials. Stress Determination by Diffraction Methods. XRD Profile Fitting, Crystallite Size and Strain Determination. XRD Applications: Detection Limits, Superconductors, Organics, Minerals. Mathematical Methods in XRay Spectrometry (XRS). Thin Film and Surface Characterization by XRS and XPS. Total Reflection XRS. XRS Techniques and Instrumentation. XRS Applications. XRay Imaging and Tomography. 161 articles. Index. 648 pp. Englisch. Seller Inventory # 9781461365327

More information about this seller | Contact seller

Buy New

US$ 58.98

Convert currency

Add to Basket

Shipping: US$ 24.63

From Germany to U.S.A.

Destination, rates & speeds

Stock Image

Advances in X-Ray Analysis: Volume 35B

Charles S. Barrett

Published by Springer-Verlag New York Inc. (2012)

ISBN 10: 1461365325 ISBN 13: 9781461365327

New Paperback / softback Quantity: > 20

Print on Demand

Seller:

THE SAINT BOOKSTORE
(Southport, United Kingdom)

Rating

Seller Rating:

Book Description Paperback / softback. Condition: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days. Seller Inventory # C9781461365327

More information about this seller | Contact seller

Buy New

US$ 73.86

Convert currency

Add to Basket

Shipping: US$ 11.20

From United Kingdom to U.S.A.

Destination, rates & speeds

Seller Image

Advances in X-Ray Analysis : Volume 35B

C. S. Barrett

Published by Springer US (2012)

ISBN 10: 1461365325 ISBN 13: 9781461365327

New Taschenbuch Quantity: 1

Seller:

AHA-BUCH GmbH
(Einbeck, Germany)

Rating

Seller Rating:

Book Description Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrumentation, Techniques, and Reference Materials. Stress Determination by Diffraction Methods. XRD Profile Fitting, Crystallite Size and Strain Determination. XRD Applications: Detection Limits, Superconductors, Organics, Minerals. Mathematical Methods in XRay Spectrometry (XRS). Thin Film and Surface Characterization by XRS and XPS. Total Reflection XRS. XRS Techniques and Instrumentation. XRS Applications. XRay Imaging and Tomography. 161 articles. Index. Seller Inventory # 9781461365327

More information about this seller | Contact seller

Buy New

US$ 64.95

Convert currency

Add to Basket

Shipping: US$ 35.32

From Germany to U.S.A.

Destination, rates & speeds

Seller Image

Advances in X-Ray Analysis

Published by Springer US (2012)

ISBN 10: 1461365325 ISBN 13: 9781461365327

New Softcover Quantity: > 20

Print on Demand

Seller:

moluna
(Greven, Germany)

Rating

Seller Rating:

Book Description Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrum. Seller Inventory # 4194709

More information about this seller | Contact seller

Buy New

US$ 53.34

Convert currency

Add to Basket

Shipping: US$ 52.45

From Germany to U.S.A.

Destination, rates & speeds

Stock Image