Yield Simulation for Integrated Circuits - Softcover

Walker, D.M.

 
9781475719321: Yield Simulation for Integrated Circuits
Softcover
ISBN 10: 1475719329 ISBN 13: 9781475719321
Publisher: Springer, 2013

This specific ISBN edition is currently not available.

Synopsis

1. Introduction.- 2. Background.- 3. Defect Models.- 4. Defect Statistics.- 5. Fault Analysis.- 6. VLASIC Implementation.- 7. Redundancy Analysis System.- 8. Fabrication Data.- 9. Conclusions and Current Research.- References.

"synopsis" may belong to another edition of this title.

Publisher
Springer
Publication date
2013
Language
English
ISBN 10 
1475719329
ISBN 13 
9781475719321
Binding
Paperback
Number of pages
224

Other Popular Editions of the Same Title

9780898382440: Yield Simulation for Integrated Circuits (The Springer International Series in Engineering and Computer Science, 33)

Featured Edition

ISBN 10:  0898382440 ISBN 13:  9780898382440
Publisher: Springer, 1987
Hardcover