Synopsis
This book examines the effectiveness of transverse electromagnetic (TEM) cells for immunity testing of electronic equipment. Drawing from numerical simulations to model a representative device in both free space and a TEM cell, the author probes current distributions and localized electromagnetic fields surrounding the equipment under test to determine how well a TEM cell approximates an ideal plane wave immunity test environment. Correlation algorithms are employed to compare the induced currents on the equipment in both environments. The author investigates the effect of varying the ratio of equipment size to TEM cell size on the correlation. The work furthers research into alternative test procedures for emissions and susceptibility testing and contributes to the debate over the modernization of current standards. By examining how well a TEM cell electrically stresses a device similarly to a free space environment, the book sheds light on the broader question of how best to simulate real-world electromagnetic interference to ensure product safety and quality.
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Numerical Comparison of Currents Induced on an Object in Free-Space and in a
Print on DemandSeller: Forgotten Books, London, United Kingdom
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Paperback. Condition: New. Print on Demand. This book examines the effectiveness of transverse electromagnetic (TEM) cells for immunity testing of electronic equipment. Drawing from numerical simulations to model a representative device in both free space and a TEM cell, the author probes current distributions and localized electromagnetic fields surrounding the equipment under test to determine how well a TEM cell approximates an ideal plane wave immunity test environment. Correlation algorithms are employed to compare the induced currents on the equipment in both environments. The author investigates the effect of varying the ratio of equipment size to TEM cell size on the correlation. The work furthers research into alternative test procedures for emissions and susceptibility testing and contributes to the debate over the modernization of current standards. By examining how well a TEM cell electrically stresses a device similarly to a free space environment, the book sheds light on the broader question of how best to simulate real-world electromagnetic interference to ensure product safety and quality. This book is a reproduction of an important historical work, digitally reconstructed using state-of-the-art technology to preserve the original format. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in the book. print-on-demand item. Seller Inventory # 9781527856905_0
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Numerical Comparison of Currents Induced on an Object in Free-Space and in a Tem Cell (Classic Reprint)
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PAP. Condition: New. New Book. Shipped from UK. Established seller since 2000. Seller Inventory # LW-9781527856905
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Numerical Comparison of Currents Induced on an Object in Free-Space and in a Tem Cell (Classic Reprint)
Seller: PBShop.store UK, Fairford, GLOS, United Kingdom
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PAP. Condition: New. New Book. Shipped from UK. Established seller since 2000. Seller Inventory # LW-9781527856905
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