Synopsis
This book details the work done by the Joint Program on Methods of Measurement for Semiconductor Materials, Process Control, and Devices. Launched in 1968 through the combined efforts of the National Bureau of Standards, the Defense Nuclear Agency, the Defense Advanced Research Projects Agency, the U.S. Navy Strategic Systems Project Office, the Air Force Weapons Laboratory and the Atomic Energy Commission, the program's purpose was to elevate the performance and reliability of discrete semiconductor devices and integrated circuits through improved measurement methods. Split into five focused sections, this book is the product of years of research, including: resistivity, generation-recombination-trapping centers, carrier mobility, die attachment evaluation, and thermal properties of devices. It explores novel testing methods, presents new measurement techniques, and lays the groundwork for improved quality control and manufacturing processes.
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Methods of Measurement for Semiconductor Materials, Process Control, and
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Paperback. Condition: New. Print on Demand. This book details the work done by the Joint Program on Methods of Measurement for Semiconductor Materials, Process Control, and Devices. Launched in 1968 through the combined efforts of the National Bureau of Standards, the Defense Nuclear Agency, the Defense Advanced Research Projects Agency, the U.S. Navy Strategic Systems Project Office, the Air Force Weapons Laboratory and the Atomic Energy Commission, the program's purpose was to elevate the performance and reliability of discrete semiconductor devices and integrated circuits through improved measurement methods. Split into five focused sections, this book is the product of years of research, including: resistivity, generation-recombination-trapping centers, carrier mobility, die attachment evaluation, and thermal properties of devices. It explores novel testing methods, presents new measurement techniques, and lays the groundwork for improved quality control and manufacturing processes. This book is a reproduction of an important historical work, digitally reconstructed using state-of-the-art technology to preserve the original format. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in the book. print-on-demand item. Seller Inventory # 9781528125512_0
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Methods of Measurement for Semiconductor Materials, Process Control, and Devices
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PAP. Condition: New. New Book. Shipped from UK. Established seller since 2000. Seller Inventory # LX-9781528125512
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Methods of Measurement for Semiconductor Materials, Process Control, and Devices
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PAP. Condition: New. New Book. Shipped from UK. Established seller since 2000. Seller Inventory # LX-9781528125512
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