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Calculations for Comparing Two-Point and Four-Point Probe Resistivity Measurements on Rectangular Bar-Shaped Semiconductor Samples (Classic Reprint) - Softcover
Synopsis
Excerpt from Calculations for Comparing Two-Point and Four-Point Probe Resistivity Measurements on Rectangular Bar-Shaped Semiconductor Samples
Fortran codes are given which enable the calculation of four-point probe correction factors for use with bar shaped samples. Samples with either plated or unplated ends are considered. The errors that arise due to probe misplacement, inaccurate sample size and shape, and non uniform end plating are also considered. Use of the re sults permits accurate comparison of two-point and four point probe resistivity measurements. The codes are in Fortran II language and were written for an ibm 7090 computer.
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This book is a reproduction of an important historical work. Forgotten Books uses state-of-the-art technology to digitally reconstruct the work, preserving the original format whilst repairing imperfections present in the aged copy. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in our edition. We do, however, repair the vast majority of imperfections successfully; any imperfections that remain are intentionally left to preserve the state of such historical works.
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- PublisherForgotten Books
- Publication date2024
- ISBN 10 1528210107
- ISBN 13 9781528210102
- BindingPaperback
- LanguageEnglish
- Number of pages32
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Calculations for Comparing Two-Point and Four-Point Probe Resistivity
Print on DemandSeller: Forgotten Books, London, United Kingdom
Seller rating 5 out of 5 stars
Paperback. Condition: New. Print on Demand. This book provides in-depth guidance on calculating and comparing four- and two-point probe resistivity measurements in rectangular bar-shaped semiconductor samples. The four-point probe method is an established technique with several shortcomings in determining resistivity. Comparing it to the two-point probe method via correction factors allows scientists to calibrate four-point probe measuring apparatus and assess accuracy in various experimental conditions. The author provides Fortran code to calculate correction factors, enabling users to explore errors due to probe geometry, sample size, and non-uniform end plating. The book incorporates a thorough analysis of accuracy limitations and a discussion of the significance of maintaining precise sample and probe parameters. This book will be an invaluable resource for those in the field of semiconductor research and development, providing a comprehensive understanding of four-point probe resistivity measurements and their application in evaluating semiconductor materials. This book is a reproduction of an important historical work, digitally reconstructed using state-of-the-art technology to preserve the original format. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in the book. print-on-demand item. Seller Inventory # 9781528210102_0
Quantity: Over 20 available
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Calculations for Comparing Two-Point and Four-Point Probe Resistivity Measurements on Rectangular Bar-Shaped Semiconductor Samples (Classic Reprint)
Seller: PBShop.store US, Wood Dale, IL, U.S.A.
Seller rating 5 out of 5 stars
PAP. Condition: New. New Book. Shipped from UK. Established seller since 2000. Seller Inventory # LX-9781528210102
Quantity: 15 available
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Calculations for Comparing Two-Point and Four-Point Probe Resistivity Measurements on Rectangular Bar-Shaped Semiconductor Samples (Classic Reprint)
Seller: PBShop.store UK, Fairford, GLOS, United Kingdom
Seller rating 4 out of 5 stars
PAP. Condition: New. New Book. Shipped from UK. Established seller since 2000. Seller Inventory # LX-9781528210102
Quantity: 15 available