Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials - Softcover

Breitenstein, Otwin; Warta, Wilhelm; Langenkamp, Martin

 
9783662083970: Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials

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Synopsis

1. Introduction.- 2. Physical and Technical Basics.- 3. Experimental Technique.- 4. Theory.- 5. Measurement Strategies.- 6. Typical Applications.- 7. Summary and Outlook.- References.- A. Thermal and IR Properties of Selected Materials.- B. Digital Micrograph Scripts for FFT Deconvolution.- List of Symbols.- Abbreviations.

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