Items related to CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled...
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test (Frontiers in Electronic Testing, 40) - Softcover
This book covers a broad range of topics related to SRAM design and testing. It includes everything from SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing.
"synopsis" may belong to another edition of this title.
From the Back Cover:
About the Author:
As technology scales into nano-meter region, design and test of Static Random Access Memories (SRAMs) becomes a highly complex task. Process disturbances and various defect mechanisms contribute to the increasing number of unstable SRAM cells with parametric sensitivity. Growing sizes of SRAM arrays increase the likelihood of cells with marginal stability and pose strict constraints on transistor parameters distributions.
Standard functional tests often fail to detect unstable SRAM cells. Undetected unstable cells deteriorate quality and reliability of the product as such cells may fail to retain the data and cause a system failure. Special design and test measures have to be taken to identify cells with marginal stability. However, it is not sufficient to identify the unstable cells. To ensure reliable system operation, unstable cells have to be repaired.
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. The emphasis of the book is on challenges and solutions of stability testing as well as on development of understanding of the link between the process technology and SRAM circuit design in modern nano-scaled technologies.
Prof. Sachdev has authored several successful books with Springer
"About this title" may belong to another edition of this title.
- PublisherSpringer
- Publication date2010
- ISBN 10 904817855X
- ISBN 13 9789048178551
- BindingPaperback
- Number of pages210
Buy New
Learn more about this copy
US$ 37.46
Shipping:
FREE
Within U.S.A.
Top Search Results from the AbeBooks Marketplace
International Edition
Cmos Sram
International Edition
Seller:
Rating
Book Description Condition: New. Brand New Paperback International Edition.We Ship to PO BOX Address also. EXPEDITED shipping option also available for faster delivery.This item may ship from the US or other locations in India depending on your location and availability. Seller Inventory # ABTR-93025
Buy New
US$ 37.46
Convert currency
Seller Image
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test (Frontiers in Electronic Testing) by Pavlov, Andrei [Paperback ]
Seller:
Rating
Book Description Soft Cover. Condition: new. Seller Inventory # 9789048178551
Buy New
US$ 174.54
Convert currency
Stock Image
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies : Process-Aware SRAM Design and Test
Published by
Springer
(2010)
ISBN 10: 904817855X
ISBN 13: 9789048178551
New
Softcover
Quantity: > 20
Seller:
Rating
Book Description Condition: New. PRINT ON DEMAND Book; New; Fast Shipping from the UK. No. book. Seller Inventory # ria9789048178551_lsuk
Buy New
US$ 176.58
Convert currency
Stock Image
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test (Frontiers in Electronic Testing, 40)
Seller:
Rating
Book Description Condition: New. Seller Inventory # ABLIING23Apr0316110338976
Buy New
US$ 188.22
Convert currency
Seller Image
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
Published by
Springer Netherlands
(2010)
ISBN 10: 904817855X
ISBN 13: 9789048178551
New
Softcover
Quantity: > 20
Seller:
Rating
Book Description Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Gives a process-aware perspective on SRAM circuit design and testProvides detailed coverage of SRAM cell stability, stability sensitivity and analytical evaluation of Static Noise MarginIntroduces the concept of stability fault modelling. Seller Inventory # 5821690
Buy New
US$ 159.71
Convert currency
Seller Image
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
Published by
Springer Netherlands Okt 2010
(2010)
ISBN 10: 904817855X
ISBN 13: 9789048178551
New
Taschenbuch
Quantity: 2
Seller:
Rating
Book Description Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. The emphasis of the book is on challenges and solutions of stability testing as well as on development of understanding of the link between the process technology and SRAM circuit design in modern nano-scaled technologies. 212 pp. Englisch. Seller Inventory # 9789048178551
Buy New
US$ 188.64
Convert currency
Seller Image
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies : Process-Aware SRAM Design and Test
Published by
Springer Netherlands
(2010)
ISBN 10: 904817855X
ISBN 13: 9789048178551
New
Taschenbuch
Quantity: 1
Seller:
Rating
Book Description Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. The emphasis of the book is on challenges and solutions of stability testing as well as on development of understanding of the link between the process technology and SRAM circuit design in modern nano-scaled technologies. Seller Inventory # 9789048178551
Buy New
US$ 190.90
Convert currency
Stock Image
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test (Frontiers in Electronic Testing, 40)
Published by
Springer
(2010)
ISBN 10: 904817855X
ISBN 13: 9789048178551
New
Softcover
Quantity: > 20
Seller:
Rating
Book Description Condition: New. Seller Inventory # I-9789048178551
Buy New
US$ 233.00
Convert currency