Glatzel Thilo (53 results)
Language: English
Published by Springer, 2011
- Hardcover
Seller: California Books, Miami, FL, U.S.A.California Books
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Language: English
Published by Springer, 2013
- Softcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
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Language: English
Published by Springer, 2011
- Hardcover
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Language: English
Published by Springer, 2011
- Hardcover
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Condition: New. A brand new book in pristine condition. Showing zero signs of shelf wear, creases, or damage.
Language: English
Published by Springer, 2013
- Softcover
Seller: Books Puddle, New York, NY, U.S.A.Books Puddle
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Condition: New. pp. 348.
Language: English
Published by Springer, 2011
- Hardcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
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Language: English
Published by Springer Berlin Heidelberg, 2013
- Softcover
Seller: moluna, Greven, Germanymoluna
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Language: English
Published by Springer Berlin Heidelberg, 2011
- Hardcover
Seller: moluna, Greven, Germanymoluna
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Gebunden. Condition: New.
Language: English
Published by Springer, 2011
- Hardcover
Seller: Books Puddle, New York, NY, U.S.A.Books Puddle
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Condition: New. pp. 348.
Language: English
Published by Springer, 2011
- Hardcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
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Condition: New. In.
Language: English
Published by Springer, 2013
- Softcover
Seller: Revaluation Books, Exeter, United KingdomRevaluation Books
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Paperback. Condition: Brand New. 2012 edition. 290 pages. 9.25x6.10x0.79 inches. In Stock.
Language: English
Published by Springer Verlag, 2011
- Hardcover
Seller: Revaluation Books, Exeter, United KingdomRevaluation Books
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Hardcover. Condition: Brand New. 2012 edition. 345 pages. 9.25x6.25x1.00 inches. In Stock.
Language: English
Published by Springer, 2013
- Softcover
Seller: preigu, Osnabrück, Germanypreigu
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Taschenbuch. Condition: Neu. Kelvin Probe Force Microscopy | Measuring and Compensating Electrostatic Forces | Sascha Sadewasser (u. a.) | Taschenbuch | Springer Series in Surface Sciences | xiv | Englisch | 2013 | Springer | EAN 9783642271137 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.…
Language: English
Published by Springer, 2011
- Hardcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
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Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert.…
Language: English
Published by Springer, 2011
- Hardcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
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Language: English
Published by Springer, 2011
- Hardcover
Seller: Mispah books, Redhill, SURRE, United KingdomMispah books
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Hardcover. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
Language: English
Published by Springer, 2013
- Softcover
Seller: Mispah books, Redhill, SURRE, United KingdomMispah books
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Paperback. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
Language: English
Published by Springer, 2019
- Softcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
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Condition: New. In.
Language: English
Published by Springer, 2018
- Hardcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
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Condition: New. In English.
Language: English
Published by Springer, 2011
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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Condition: As New. Unread book in perfect condition.
Language: English
Published by Springer, 2018
- Hardcover
Seller: BUCHSERVICE / ANTIQUARIAT Lars Lutzer, Wahlstedt, GermanyBUCHSERVICE / ANTIQUARIAT Lars Lutzer
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Hardcover. Condition: gut. 2018. Springer Series in Surface Sciences - 65: Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization In deutscher Sprache. pages.
Language: English
Published by Cham, Springer, 2018
- Hardcover
Seller: Antiquariat Bookfarm, Löbnitz, GermanyAntiquariat Bookfarm
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Hardcover. Condition: Gut. xxiv, 521 S. Ehem. Bibliotheksexemplar mit Signatur und Stempel. GUTER Zustand, ein paar Gebrauchsspuren. Ex-library in GOOD condition with library-signature and stamp(s). Some traces of use. R-16212 9783319756868 Sprache: Englisch Gewicht in Gramm: 1050.
Language: English
Published by Springer, 2019
- Softcover
Seller: preigu, Osnabrück, Germanypreigu
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Taschenbuch. Condition: Neu. Kelvin Probe Force Microscopy | From Single Charge Detection to Device Characterization | Sascha Sadewasser (u. a.) | Taschenbuch | Springer Series in Surface Sciences | xxiv | Englisch | 2019 | Springer | EAN 9783030092986 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.…
Language: English
Published by Springer, 2019
- Softcover
Seller: Books Puddle, New York, NY, U.S.A.Books Puddle
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Condition: New.
Language: English
Published by Springer, 2018
- Hardcover
Seller: Books Puddle, New York, NY, U.S.A.Books Puddle
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Condition: New. 1st ed. 2018 edition NO-PA16APR2015-KAP.
Language: English
Published by Springer, 2019
- Softcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
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US$ 390.90
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular and atomic scale electrostatics.In the last 25 years, Kelvin probe force microscopy has developed from a specialized technique applied by a few scanning probe microscopy experts into a tool used by numerous research and development groups around the globe. This sequel to the editors' previous volume 'Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces,' presents new and complementary topics.It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field. …
Language: English
Published by Springer, 2018
- Hardcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
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US$ 393.27
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Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular and atomic scale electrostatics.In the last 25 years, Kelvin probe force microscopy has developed from a specialized technique applied by a few scanning probe microscopy experts into a tool used by numerous research and development groups around the globe. This sequel to the editors' previous volume 'Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces,' presents new and complementary topics.It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field. …
Language: English
Published by Springer, 2018
- Hardcover
Seller: Revaluation Books, Exeter, United KingdomRevaluation Books
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US$ 401.42
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Hardcover. Condition: Brand New. 521 pages. 9.50x6.25x1.25 inches. In Stock.
Language: English
Published by Springer, 2019
- Softcover
Seller: Mispah books, Redhill, SURRE, United KingdomMispah books
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US$ 421.64
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Paperback. Condition: New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
Language: English
Published by Springer, 2018
- Hardcover
Seller: Mispah books, Redhill, SURRE, United KingdomMispah books
Contact seller4-star sellerCondition: New
US$ 421.64
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Hardcover. Condition: New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
