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Anis, Mohab; Elmasry, Mohamed (20 results)
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Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
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Brand new book. Fast ship. Please provide full street address as we are not able to ship to P O box address.
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Design for Yield and Reliability for Nanometer CMOS Digital Circuits
Published by VDM Verlag Dr. Mueller Aktiengesellschaft & Co. KG, 2014
ISBN 10: 365951361X ISBN 13: 9783659513619
Language: English
Condition: New. pp. 296.
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Condition: New.
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Condition: New.
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Condition: New.
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Multi-Threshold CMOS Digital Circuits: Managing Leakage Power
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 126.97
US$ 15.69 shipping from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Multi-Threshold CMOS Digital Circuits: Managing Leakage Power
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 126.97
US$ 15.69 shipping from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Multi-Threshold Cmos Digital Circuits : Managing Leakage Power
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 126.95
US$ 19.64 shipping from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New.
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Hardcover. Condition: Brand New. 1st edition. 216 pages. 9.25x6.25x0.75 inches. In Stock.
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Gebunden. Condition: New. This excellent survey of state-of-the-art techniques discusses the MTCMOS technology that has emerged as an increasingly popular technique to control the escalating leakage power, while maintaining high performance. It addresses the leakage problem in a .
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Multi-Threshold Cmos Digital Circuits : Managing Leakage Power
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 194.23
US$ 19.64 shipping from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: As New. Unread book in perfect condition.
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Hardcover. Condition: Like New. Like New. book.
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Condition: As New. Unread book in perfect condition.
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Paperback. Condition: Like New. Like New. book.
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Design for Yield and Reliability for Nanometer CMOS Digital Circuits: Statistical design, Soft errors modeling, Adaptive body bias, Negative capacitance circuits
Published by LAP LAMBERT Academic Publishing, 2014
ISBN 10: 365951361X ISBN 13: 9783659513619
Language: English
paperback. Condition: New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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Design for Yield and Reliability for Nanometer CMOS Digital Circuits
Published by LAP LAMBERT Academic Publishing, 2014
ISBN 10: 365951361X ISBN 13: 9783659513619
Language: English
Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Mostafa HassanDr. Hassan Mostafa received his PhD in Electrical and Computer Engineering from the University of Waterloo, Canada in 2011. Dr. Mostafa has worked as a research associate with Fujitsu labs (Japan), University of Toronto.
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Design for Yield and Reliability for Nanometer CMOS Digital Circuits
Published by VDM Verlag Dr. Mueller Aktiengesellschaft & Co. KG, 2014
ISBN 10: 365951361X ISBN 13: 9783659513619
Language: English
Condition: New. Print on Demand pp. 296 2:B&W 6 x 9 in or 229 x 152 mm Perfect Bound on Creme w/Gloss Lam.
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Design for Yield and Reliability for Nanometer CMOS Digital Circuits
Published by VDM Verlag Dr. Mueller Aktiengesellschaft & Co. KG, 2014
ISBN 10: 365951361X ISBN 13: 9783659513619
Language: English
Condition: New. PRINT ON DEMAND pp. 296.
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This excellent survey of state-of-the-art techniques discusses the MTCMOS technology that has emerged as an increasingly popular technique to control the escalating leakage power, while maintaining high performance. It addresses the leakage problem in a .
