Girard Patrick Edt (14 results)
Machine Learning Support for Fault Diagnosis of System-on-chip
Girard, Patrick (EDT); Blanton, Shawn (EDT); Wang, Li-c. (EDT)
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: Used - As new
US$ 109.74
US$ 2.64 shippingShips within U.S.A.Quantity: Over 20 available
Condition: As New. Unread book in perfect condition.
Language: English
Published by Springer, 2011
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: Used - As new
US$ 124.34
US$ 2.64 shippingShips within U.S.A.Quantity: 15 available
Condition: As New. Unread book in perfect condition.
Machine Learning Support for Fault Diagnosis of System-on-chip
Girard, Patrick (EDT); Blanton, Shawn (EDT); Wang, Li-c. (EDT)
- Hardcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
Contact seller5-star sellerCondition: Used - As new
US$ 114.08
US$ 19.85 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: As New. Unread book in perfect condition.
Machine Learning Support for Fault Diagnosis of System-on-chip
Girard, Patrick (EDT); Blanton, Shawn (EDT); Wang, Li-c. (EDT)
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: New
US$ 128.17
US$ 2.64 shippingShips within U.S.A.Quantity: Over 20 available
Condition: New.
Machine Learning Support for Fault Diagnosis of System-on-chip
Girard, Patrick (EDT); Blanton, Shawn (EDT); Wang, Li-c. (EDT)
- Hardcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
Contact seller5-star sellerCondition: New
US$ 114.69
US$ 19.85 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: New.
Language: English
Published by Springer, 2013
- Softcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: Used - As new
US$ 137.66
US$ 2.64 shippingShips within U.S.A.Quantity: 15 available
Condition: As New. Unread book in perfect condition.
Language: English
Published by Springer, 2011
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: New
US$ 138.35
US$ 2.64 shippingShips within U.S.A.Quantity: 15 available
Condition: New.
Language: English
Published by Springer, 2013
- Softcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: New
US$ 146.54
US$ 2.64 shippingShips within U.S.A.Quantity: 15 available
Condition: New.
Language: English
Published by Springer, 2011
- Hardcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
Contact seller5-star sellerCondition: New
US$ 139.53
US$ 19.85 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: New.
Language: English
Published by Springer, 2011
- Hardcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
Contact seller5-star sellerCondition: Used - As new
US$ 141.37
US$ 19.85 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: As New. Unread book in perfect condition.
Power-aware Testing and Test Strategies for Low Power Devices
Girard, Patrick (EDT); Nicolici, Nicola (EDT); Wen, Xiaoqing (EDT)
- Softcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: New
US$ 158.90
US$ 2.64 shippingShips within U.S.A.Quantity: 15 available
Condition: New.
Power-Aware Testing and Test Strategies for Low Power Devices
Girard, Patrick (EDT); Nicolici, Nicola (EDT); Wen, Xiaoqing (EDT)
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: New
US$ 208.28
US$ 2.64 shippingShips within U.S.A.Quantity: 15 available
Condition: New.
Power-Aware Testing and Test Strategies for Low Power Devices
Girard, Patrick (EDT); Nicolici, Nicola (EDT); Wen, Xiaoqing (EDT)
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: Used - As new
US$ 210.19
US$ 2.64 shippingShips within U.S.A.Quantity: 15 available
Condition: As New. Unread book in perfect condition.
Power-aware Testing and Test Strategies for Low Power Devices
Girard, Patrick (EDT); Nicolici, Nicola (EDT); Wen, Xiaoqing (EDT)
- Softcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: Used - As new
US$ 255.24
US$ 2.64 shippingShips within U.S.A.Quantity: 15 available
Condition: As New. Unread book in perfect condition.
