Goessel Michael (139 results)
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Taschenbuch. Condition: Gut. 118 Seiten; Der Erhaltungszustand des hier angebotenen Werks ist trotz seiner Bibliotheksnutzung sehr sauber. Es befindet sich neben dem Rückenschild lediglich ein Bibliotheksstempel im Buch; ordnungsgemäß entwidmet. Leichte altersbedingte Anbräunung des Papiers. Sprache: Deutsch Gewicht in Gramm: 11…0.
New Methods Of Concurrent Checking (frontiers In Electronic Testing)
Gössel, Michael; Ocheretny, Vitaly; Sogomonyan, Egor; Marienfeld, Daniel
Language: English
Published by Springer 2008
Series: Frontiers in Electronic Testing, Book 20 of 40. Book 20 of 40 - Frontiers in Electronic Testing
- Hardcover
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Language: English
Published by Springer 2008
Series: Frontiers in Electronic Testing, Book 20 of 40. Book 20 of 40 - Frontiers in Electronic Testing
- Hardcover
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New Methods Of Concurrent Checking: Preliminary Entry 42
Gössel, Michael; Ocheretny, Vitaly; Sogomonyan, Egor; Marienfeld, Daniel
Language: English
Published by Springer 2008
Series: Frontiers in Electronic Testing, Book 20 of 40. Book 20 of 40 - Frontiers in Electronic Testing
- Hardcover
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New Methods Of Concurrent Checking: Preliminary Entry 42
Gössel, Michael; Ocheretny, Vitaly; Sogomonyan, Egor; Marienfeld, Daniel
Language: English
Published by Springer 2008
Series: Frontiers in Electronic Testing, Book 20 of 40. Book 20 of 40 - Frontiers in Electronic Testing
- Hardcover
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Condition: New. Brand New Original US Edition. Customer service! Satisfaction Guaranteed.
Published by Berlin, Akademie-Verlag, 1987, 1. Aufl. 1987
- Hardcover
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Hardcover. Mit 63 Abbildungen und 33 Tabellen. Pappband, 146 Seiten, 24,5 x 17,5 cm. Gewicht: 362.
New Methods of Concurrent Checking (Frontiers in Electronic Testing, 42)
Gössel, Michael; Ocheretny, Vitaly; Sogomonyan, Egor; Marienfeld, Daniel
Language: English
Published by Springer 2008
Series: Frontiers in Electronic Testing, Book 20 of 40. Book 20 of 40 - Frontiers in Electronic Testing
- Hardcover
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New Methods of Concurrent Checking
Goessel, Michael; Ocheretny, Vitaly; Sogomonyan, Egor; Marienfeld, Daniel
Language: English
Published by Springer 2008
Series: Frontiers in Electronic Testing, Book 20 of 40. Book 20 of 40 - Frontiers in Electronic Testing
- Hardcover
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New Methods of Concurrent Checking (Frontiers in Electronic Testing, 42)
Gössel, Michael; Ocheretny, Vitaly; Sogomonyan, Egor; Marienfeld, Daniel
Language: English
Published by Springer 2010
Series: Frontiers in Electronic Testing, Book 20 of 40. Book 20 of 40 - Frontiers in Electronic Testing
- Softcover
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More imagesLanguage: English
Published by Springer 2010
Series: Frontiers in Electronic Testing, Book 20 of 40. Book 20 of 40 - Frontiers in Electronic Testing
- Softcover
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Taschenbuch. Condition: Neu. New Methods of Concurrent Checking | Michael Gössel (u. a.) | Taschenbuch | viii | Englisch | 2010 | Springer | EAN 9789048178766 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
Language: English
Published by Springer, Springer 2010
Series: Frontiers in Electronic Testing, Book 20 of 40. Book 20 of 40 - Frontiers in Electronic Testing
- Softcover
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Computers are everywhere around us. We, for example, as air passengers, car drivers, laptop users with Internet connection, cell phone owners, hospital patients, inhabitants in the vicinity of a nuclear power station, students in a digital library…or customers in a supermarket are dependent on their correct operation. Computers are incredibly fast, inexpensive and equipped with almost unimag- able large storage capacity. Up to 100 million transistors per chip are quite common today - a single transistor for each citizen of a large capital city in the world can be 2 easily accommodated on an ordinary chip. The size of such a chip is less than 1 cm . This is a fantastic achievement for an unbelievably low price. However, the very small and rapidly decreasing dimensions of the transistors and their connections over the years are also the reason for growing problems with reliability that will dramatically increase for the nano-technologies in the near future. Can we always trust computers Are computers always reliable Are chips suf- ciently tested with respect to all possible permanent faults if we buy them at a low price or have errors due to undetected permanent faults to be discovered by c- current checking Besides permanent faults, many temporary or transient faults are also to be expected.
Language: English
Published by Springer 2008
Series: Frontiers in Electronic Testing, Book 20 of 40. Book 20 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
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Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Computers are everywhere around us. We, for example, as air passengers, car drivers, laptop users with Internet connection, cell phone owners, hospital patients, inhabitants in the vicinity of a nuclear power station, students in a digital library or cust…omers in a supermarket are dependent on their correct operation. Computers are incredibly fast, inexpensive and equipped with almost unimag- able large storage capacity. Up to 100 million transistors per chip are quite common today - a single transistor for each citizen of a large capital city in the world can be 2 easily accommodated on an ordinary chip. The size of such a chip is less than 1 cm . This is a fantastic achievement for an unbelievably low price. However, the very small and rapidly decreasing dimensions of the transistors and their connections over the years are also the reason for growing problems with reliability that will dramatically increase for the nano-technologies in the near future. Can we always trust computers Are computers always reliable Are chips suf- ciently tested with respect to all possible permanent faults if we buy them at a low price or have errors due to undetected permanent faults to be discovered by c- current checking Besides permanent faults, many temporary or transient faults are also to be expected.
New Methods of Concurrent Checking (Frontiers in Electronic Testing (42))
Gössel, Michael, Ocheretny, Vitaly, Sogomonyan, Egor, Marien
Language: English
Published by Springer 2010
Series: Frontiers in Electronic Testing, Book 20 of 40. Book 20 of 40 - Frontiers in Electronic Testing
- Softcover
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New Methods of Concurrent Checking (Frontiers in Electronic Testing)
Gössel, Michael, Ocheretny, Vitaly, Sogomonyan, Egor, Marien
Language: English
Published by Springer 2008
Series: Frontiers in Electronic Testing, Book 20 of 40. Book 20 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: Mispah books, Redhill, SURRE, United KingdomMispah books
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Hardcover. Condition: Like New. Like New. book.
New Methods of Concurrent Checking
Goessel, Michael; Ocheretny, Vitaly; Sogomonyan, Egor; Marienfeld, Daniel
Language: English
Published by Springer 2008
Series: Frontiers in Electronic Testing, Book 20 of 40. Book 20 of 40 - Frontiers in Electronic Testing
- Hardcover
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Condition: As New. Unread book in perfect condition.
Published by Akademie-Verlag, Berlin 1972
- Softcover
Seller: Antiquariat Kastanienhof, Pirna, GermanyAntiquariat Kastanienhof
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Taschenbuch. Condition: Gut. 11*18 cm Zustand gut orginal Karton--- Für Ihre Zufriedenheit versenden wir mit DHL und ausschließlich mit Trackingcode für eine sichere Sendungsverfolgung! Weitere Angebote unter antiquariat-kastanienhof , 102 Seiten. nein.
Published by Stadtdruckerei Weidner, Rostock, 2000 2000
- Softcover
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Condition: siehe Beschreibung. original Heft, ca. DIN A4 Format, nicht geheftet, 7 Seiten + 4 Seiten Umschlag mit Besetzungsliste. Zustand: gut The Tragedy of King Lear. Regie: Alejandro Quintana. Ausstattung: Falk von Wangelin. Musik: Roberto Rivera. Mitwirkende: Horst Westphal, Katrin Steinke, Iris Albrecht, Christina Dom, Tob…ias Weber, Jan Baake, Alexandre Pelichet, Siegfried Kadow, u.a. ------- Program booklet William Shakespeare KING LEAR Volkstheater Rostock 2000 - Original booklet, approximately DIN A4 format, not stapled, 7 pages + 4-page cover with cast list. Condition: good - The Tragedy of King Lear. Directed by Alejandro Quintana. Set design by Falk von Wangelin. Music by Roberto Rivera. Starring: Horst Westphal, Katrin Steinke, Iris Albrecht, Christina Dom, Tobias Weber, Jan Baake, Alexandre Pelichet, Siegfried Kadow, and others. deu.
Published by Berlin. Akademie-Verlag. 1975. 1975
- Softcover
Seller: Antiquariat am Flughafen, Berlin, GermanyAntiquariat am Flughafen
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Softcover. Condition: sehr gut. Taschenbuch (Nr. 149) 156 Seiten, mit 35 Abbildungen und 5 Tabellen, mit leichten Gebrauchsspuren, Wissenschaftliche Taschenbücher, Mathematik . Physik. Nummer 1489 in deutscher Sprache.
Language: German
Published by Akademie-Verlag Pergamon Press Berlin, Oxford 1972
- Softcover
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Taschenbuch 11*18 cm. Condition: Gut. 118 Seiten altersbedingt guter Zustand, leichte Gebrauchsspuren, Unterstreichungen in begrenztem Ausmaß, mx68240 Sprache: Deutsch Gewicht in Gramm: 100.
Seller: Antiquariat Bookfarm, Löbnitz, GermanyAntiquariat Bookfarm
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146 S. : 63 Ill. Ehemaliges Bibliotheksexemplar mit Stempel und Signatur in Mittelmäßige Zustand. Text Sauber. Einband beschädigt. 3055000358 Sprache: Deutsch Gewicht in Gramm: 550.
- Hardcover
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- Hardcover
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- Hardcover
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- Hardcover
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