Khare Jitendra (22 results)
Language: English
Published by Kluwer 1996
Series: Frontiers in Electronic Testing, Book 28 of 40. Book 28 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: Zubal-Books, Since 1961, Cleveland, OH, U.S.A.Zubal-Books, Since 1961
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Condition: Good. 150 pp., Hardcover, ex library else text clean and binding tight. - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country.
Language: English
Published by Springer 1996
Series: Frontiers in Electronic Testing, Book 28 of 40. Book 28 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: Romtrade Corp., STERLING HEIGHTS, MI, U.S.A.Romtrade Corp.
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Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
Language: English
Published by Springer 1996
Series: Frontiers in Electronic Testing, Book 28 of 40. Book 28 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: Basi6 International, Irving, TX, U.S.A.Basi6 International
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Language: English
Published by Springer 1996
Series: Frontiers in Electronic Testing, Book 28 of 40. Book 28 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: BennettBooksLtd, Los Angeles, CA, U.S.A.BennettBooksLtd
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hardcover. Condition: New. In shrink wrap. Looks like an interesting title.
Language: English
Published by Springer 1996
Series: Frontiers in Electronic Testing, Book 28 of 40. Book 28 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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Language: English
Published by Springer 2011
Series: Frontiers in Electronic Testing, Book 28 of 40. Book 28 of 40 - Frontiers in Electronic Testing
- Softcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
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US$ 131.72
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Condition: New. In.
Language: English
Published by Springer 1996
Series: Frontiers in Electronic Testing, Book 28 of 40. Book 28 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
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US$ 131.72
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Condition: New. In.
Language: English
Published by Springer 1996
Series: Frontiers in Electronic Testing, Book 28 of 40. Book 28 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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Condition: New.
Language: English
Published by Springer 1996
Series: Frontiers in Electronic Testing, Book 28 of 40. Book 28 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
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US$ 131.71
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Condition: New.
Language: English
Published by Springer US 1996
Series: Frontiers in Electronic Testing, Book 28 of 40. Book 28 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: Buchpark, Trebbin, , GermanyBuchpark
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Condition: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher | Over the years there has been a large increase in the functionality available on a single integrated circuit. This has been mainly achieved by a continuous drive towards smaller feature sizes, larger dies, and better packing efficiency. However, th…is greater functionality has also resulted in substantial increases in the capital investment needed to build fabrication facilities. Given such a high level of investment, it is critical for IC manufacturers to reduce manufacturing costs and get a better return on their investment. The most obvious method of reducing the manufacturing cost per die is to improve manufacturing yield. Modern VLSI research and engineering (which includes design manufacturing and testing) encompasses a very broad range of disciplines such as chemistry, physics, material science, circuit design, mathematics and computer science. Due to this diversity, the VLSI arena has become fractured into a number of separate sub-domains with little or no interaction between them. This is the case with the relationships between testing and manufacturing. From Contamination to Defects, Faults and Yield Loss: Simulation and Applications focuses on the core of the interface between manufacturing and testing, i.e., the contamination-defect-fault relationship. The understanding of this relationship can lead to better solutions of many manufacturing and testing problems. Failure mechanism models are developed and presented which can be used to accurately estimate probability of different failures for a given IC. This information is critical in solving key yield-related applications such as failure analysis, fault modeling and design manufacturing.
Language: English
Published by Springer 1996
Series: Frontiers in Electronic Testing, Book 28 of 40. Book 28 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
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US$ 144.21
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Condition: As New. Unread book in perfect condition.
Language: English
Published by Kluwer Academic Publishers 1996
Series: Frontiers in Electronic Testing, Book 28 of 40. Book 28 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, IrelandKennys Bookshop and Art Galleries Ltd.
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US$ 155.38
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Condition: New. States that over the years there has been a large increase in the functionality available on a single integrated circuit. This book focuses on the core of the interface between manufacturing and testing, ie, the contamination-defect-fault relationship. Series: Frontiers in Electronic Testing. Num Pages: 166 pages…, biography. BIC Classification: TJFC; TJFD. Category: (P) Professional & Vocational; (XV) Technical / Manuals. Dimension: 234 x 156 x 11. Weight in Grams: 930. . 1996. Hardback. . . . .
Language: English
Published by Springer 2011
Series: Frontiers in Electronic Testing, Book 28 of 40. Book 28 of 40 - Frontiers in Electronic Testing
- Softcover
Seller: Books Puddle, New York, NY, U.S.A.Books Puddle
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US$ 162.20
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Condition: New. pp. 172.
Language: English
Published by Kluwer Academic Publishers 1996
Series: Frontiers in Electronic Testing, Book 28 of 40. Book 28 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: Kennys Bookstore, Olney, MD, U.S.A.Kennys Bookstore
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US$ 186.07
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Condition: New. States that over the years there has been a large increase in the functionality available on a single integrated circuit. This book focuses on the core of the interface between manufacturing and testing, ie, the contamination-defect-fault relationship. Series: Frontiers in Electronic Testing. Num Pages: 166 pages…, biography. BIC Classification: TJFC; TJFD. Category: (P) Professional & Vocational; (XV) Technical / Manuals. Dimension: 234 x 156 x 11. Weight in Grams: 930. . 1996. Hardback. . . . . Books ship from the US and Ireland.
Language: English
Published by Springer 2011
Series: Frontiers in Electronic Testing, Book 28 of 40. Book 28 of 40 - Frontiers in Electronic Testing
- Softcover
Seller: Mispah books, Redhill, SURRE, United KingdomMispah books
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US$ 187.62
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Paperback. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
- Softcover
Seller: Celler Versandantiquariat, Eicklingen, , GermanyCeller Versandantiquariat
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Kluwer Academic Publishers, Boston, 1996. 150 pages, Paperback--- - former library book in good condition - 468 Gramm.
Language: English
Published by Springer 2011
Series: Frontiers in Electronic Testing, Book 28 of 40. Book 28 of 40 - Frontiers in Electronic Testing
- Softcover
- Print on Demand
Seller: Brook Bookstore On Demand, Napoli, NA, ItalyBrook Bookstore On Demand
Contact seller3-star sellerCondition: New
US$ 101.09
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Condition: new. Questo è un articolo print on demand.
Language: English
Published by Springer US 2011
Series: Frontiers in Electronic Testing, Book 28 of 40. Book 28 of 40 - Frontiers in Electronic Testing
- Softcover
- Print on Demand
Seller: moluna, Greven, , Germanymoluna
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US$ 108.15
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Over the years there has been a large increase in the functionality available on a single integrated circuit. This has been mainly achieved by a continuous drive towards smaller feature sizes, larger dies, and better…packing efficiency. However, this gre.
Language: English
Published by Springer US 1996
Series: Frontiers in Electronic Testing, Book 28 of 40. Book 28 of 40 - Frontiers in Electronic Testing
- Hardcover
- Print on Demand
Seller: moluna, Greven, , Germanymoluna
Contact seller5-star sellerCondition: New
US$ 108.15
US$ 55.75 shippingShips from Germany to U.S.A.Quantity: Over 20 available
Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Over the years there has been a large increase in the functionality available on a single integrated circuit. This has been mainly achieved by a continuous drive towards smaller feature sizes, larger dies, and better…packing efficiency. However, this gre.
Language: English
Published by Springer 2011
Series: Frontiers in Electronic Testing, Book 28 of 40. Book 28 of 40 - Frontiers in Electronic Testing
- Softcover
- Print on Demand
Seller: Majestic Books, Hounslow, , United KingdomMajestic Books
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US$ 167.46
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Condition: New. Print on Demand pp. 172 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam.
Language: English
Published by Springer 2011
Series: Frontiers in Electronic Testing, Book 28 of 40. Book 28 of 40 - Frontiers in Electronic Testing
- Softcover
- Print on Demand
Seller: Biblios, frankfurt am main, HESSE, GermanyBiblios
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US$ 177.03
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Condition: New. PRINT ON DEMAND pp. 172.
More imagesLanguage: English
Published by Springer 1996
Series: Frontiers in Electronic Testing, Book 28 of 40. Book 28 of 40 - Frontiers in Electronic Testing
- Hardcover
- Print on Demand
Seller: preigu, Osnabrück, Germanypreigu
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US$ 112.17
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Buch. Condition: Neu. From Contamination to Defects, Faults and Yield Loss | Simulation and Applications | Jitendra B. Khare (u. a.) | Buch | Frontiers in Electronic Testing | Einband - fest (Hardcover) | Englisch | 1996 | Springer | EAN 9780792397144 | Verantwortliche Person für die EU: Springer Nature Customer Service Center G…mbH, Europaplatz 3, 69115 Heidelberg, productsafety[at]springernature[dot]com | Anbieter: preigu Print on Demand.
