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Condition: very_good. Gently read. May have name of previous ownership, or ex-library edition. Binding tight; spine straight and smooth, with no creasing; covers clean and crisp. Minimal signs of handling or shelving. 100% GUARANTEE! Shipped with delivery confirmation, if you're not satisfied with purchase please return item for full refund. Ships USPS Media Mail.
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Principles of Analytical Electron Microscopy
Language: English
Published by Springer (edition 1986), 1986
ISBN 10: 0306423871 ISBN 13: 9780306423871
Hardcover. Condition: Fair. 1986. The item might be beaten up but readable. May contain markings or highlighting, as well as stains, bent corners, or any other major defect, but the text is not obscured in any way.
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Hardcover. Condition: Very Good. No Jacket. Missing dust jacket; May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less.
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Hardcover. Condition: Good. No Jacket. Missing dust jacket; Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less.
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Hardcover. Condition: Good. No Jacket. Missing dust jacket; Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less.
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Condition: Very Good. Former library copy. Pages intact with possible writing/highlighting. Binding strong with minor wear. Dust jackets/supplements may not be included. Includes library markings. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.
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Hardcover. Condition: Acceptable. Connecting readers with great books since 1972. Used textbooks may not include companion materials such as access codes, etc. May have condition issues including wear and notes/highlighting. We ship orders daily and Customer Service is our top priority!
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Hardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
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Hardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
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Hardcover. Condition: Good. hardback book in good condition,upper corner near rear panel has slight moist air exposure.
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Condition: Very Good. Hardcover, [xviii], 820 pages. Very Good condition in a Good dust jacket. Second edition. Size 10.25"x7.5". "The authors, emphasizing the practical aspects of the techniques described, discuss user-controlled functions of scanning electron microscope and electron microprobe electron optics, the characteristics of electron-specimen interactions, image formation and interpretation, and x-ray spectrometry." Book has moderate handling/shelfwear. Previous owner's name on front fly. Binding is tight. Text is clean and unmarked. Dust jacket has edgewear and sunned spine.
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Principles of Analytical Electron Microscopy
Seller: books4less (Versandantiquariat Petra Gros GmbH & Co. KG), Welling, Germany
Seller rating 5 out of 5 stars
gebundene Ausgabe. Condition: Gut. 448 Seiten Der Erhaltungszustand des hier angebotenen Werks ist trotz seiner Bibliotheksnutzung sehr sauber. Es befindet sich neben dem Rückenschild lediglich ein Bibliotheksstempel im Buch; ordnungsgemäß entwidmet. Einbandkanten sind leicht bestoßen. Leichte altersbedingte Anbräunung des Papiers. In ENGLISCHER Sprache. Sprache: Englisch Gewicht in Gramm: 1005.
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Paperback. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
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Hardcover. Condition: Near Fine. Dust Jacket Condition: Very Good. 2nd Edition. Hardback in near fine condition with a very good plus dust jacket. 2nd Edition.
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Principles of Analytical Electron Microscopy
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 63.16
US$ 16.20 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Jun 01, 1992. Condition: gebraucht; wie neu. Hardcover mit Schutzumschlag, dieser mit minimalen Standspuren, Buch selbst ist ungebraucht, 2. Auflage.
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Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 133.91
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Add to basketCondition: New. In.
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Structure/Property Relationships for Metal/Metal Interfaces
Language: English
Published by Materials Research Society, Pittsburgh PA, 1990
ISBN 10: 1558991239 ISBN 13: 9781558991231
First Edition
Hardcover. Condition: Good. Dust Jacket Condition: No Dust Jacket. First Edition. An ex-library copy in original blue hard covers lettered in white. The usual ex-libris markings. The binding is sound, the text is clean/unmarked, and there is little cover wear. No dust jacket, apparently as issued. Book.
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US$ 112.09
US$ 57.78 shipping
Ships from Germany to U.S.A.Quantity: Over 20 available
Add to basketCondition: New.
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Principles of Analytical Electron Microscopy
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 190.51
US$ 16.20 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Principles of Analytical Electron Microscopy
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 192.65
US$ 16.20 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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US$ 190.51
US$ 20.28 shipping
Ships from United Kingdom to U.S.A.Quantity: 2 available
Add to basketPaperback. Condition: Brand New. 2nd edition. 840 pages. 10.00x7.00x1.67 inches. In Stock.
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Condition: New. pp. 468.
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Principles of Analytical Electron Microscopy
Language: English
Published by Springer US, Springer New York Jul 2013, 2013
ISBN 10: 1489920390 ISBN 13: 9781489920393
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. Neuware -Since the publication in 1979 of Introduction to Analytical Electron Microscopy (ed. J. J. Hren, J. I. Goldstein, and D. C. Joy; Plenum Press), analytical electron microscopy has continued to evolve and mature both as a topic for fundamental scientific investigation and as a tool for inorganic and organic materials characterization. Significant strides have been made in our understanding of image formation, electron diffraction, and beam/specimen interactions, both in terms of the 'physics of the processes' and their practical implementation in modern instruments. It is the intent of the editors and authors of the current text, Principles of Analytical Electron Microscopy, to bring together, in one concise and readily accessible volume, these recent advances in the subject. The text begins with a thorough discussion of fundamentals to lay a foundation for today's state-of-the-art microscopy. All currently important areas in analytical electron microscopy-including electron optics, electron beam/specimen interactions, image formation, x-ray microanalysis, energy-loss spectroscopy, electron diffraction and specimen effects-have been given thorough attention. To increase the utility of the volume to a broader cross section of the scientific community, the book's approach is, in general, more descriptive than mathematical. In some areas, however, mathematical concepts are dealt with in depth, increasing the appeal to those seeking a more rigorous treatment of the subject.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 468 pp. Englisch.
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Structure/Property Relationships for Metal/Metal Interfaces: Volume 229 (MRS Proceedings)
Language: English
Published by Cambridge University Press, 1991
ISBN 10: 1558991239 ISBN 13: 9781558991231
US$ 236.77
US$ 33.81 shipping
Ships from United Kingdom to U.S.A.Quantity: 1 available
Add to basketHardcover. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Since the publication in 1979 of Introduction to Analytical Electron Microscopy (ed. J. J. Hren, J. I. Goldstein, and D. C. Joy; Plenum Press), analytical electron microscopy has continued to evolve and mature both as a topic for fundamental scientific investigation and as a tool for inorganic and organic materials characterization. Significant strides have been made in our understanding of image formation, electron diffraction, and beam/specimen interactions, both in terms of the 'physics of the processes' and their practical implementation in modern instruments. It is the intent of the editors and authors of the current text, Principles of Analytical Electron Microscopy, to bring together, in one concise and readily accessible volume, these recent advances in the subject. The text begins with a thorough discussion of fundamentals to lay a foundation for today's state-of-the-art microscopy. All currently important areas in analytical electron microscopy-including electron optics, electron beam/specimen interactions, image formation, x-ray microanalysis, energy-loss spectroscopy, electron diffraction and specimen effects-have been given thorough attention. To increase the utility of the volume to a broader cross section of the scientific community, the book's approach is, in general, more descriptive than mathematical. In some areas, however, mathematical concepts are dealt with in depth, increasing the appeal to those seeking a more rigorous treatment of the subject.
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Principles of Analytical Electron Microscopy
Language: English
Published by Springer, Chapman And Hall/CRC, 2013
ISBN 10: 1489920390 ISBN 13: 9781489920393
Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Since the publication in 1979 of Introduction to Analytical Electron Microscopy (ed. J. J. Hren, J. I. Goldstein, and D. C. Joy; Plenum Press), analytical electron microscopy has continued to evolve and mature both as a topic for fundamental scientific investigation and as a tool for inorganic and organic materials characterization. Significant strides have been made in our understanding of image formation, electron diffraction, and beam/specimen interactions, both in terms of the 'physics of the processes' and their practical implementation in modern instruments. It is the intent of the editors and authors of the current text, Principles of Analytical Electron Microscopy, to bring together, in one concise and readily accessible volume, these recent advances in the subject. The text begins with a thorough discussion of fundamentals to lay a foundation for today's state-of-the-art microscopy. All currently important areas in analytical electron microscopy-including electron optics, electron beam/specimen interactions, image formation, x-ray microanalysis, energy-loss spectroscopy, electron diffraction and specimen effects-have been given thorough attention. To increase the utility of the volume to a broader cross section of the scientific community, the book's approach is, in general, more descriptive than mathematical. In some areas, however, mathematical concepts are dealt with in depth, increasing the appeal to those seeking a more rigorous treatment of the subject.
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US$ 271.99
US$ 16.90 shipping
Ships from United Kingdom to U.S.A.Quantity: 2 available
Add to basketPaperback. Condition: Brand New. reprint edition. 464 pages. 9.26x6.11x1.20 inches. In Stock.
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US$ 266.02
US$ 33.81 shipping
Ships from United Kingdom to U.S.A.Quantity: 1 available
Add to basketHardcover. Condition: Very Good. Very Good. book.
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US$ 267.42
US$ 33.81 shipping
Ships from United Kingdom to U.S.A.Quantity: 1 available
Add to basketPaperback. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
