Sclaroff Stan (192 results)

Pattern Recognition and Information Forensics : Icpr 2020 International Workshops, Virtual Event, January 10-11, 2021, Proceedings
Del Bimbo, Alberto (EDT); Cucchiara, Rita (EDT); Sclaroff, Stan (EDT); Farinella, Giovanni Maria (EDT); Mei, Tao (EDT)
Language: English
Published by Springer, 2021
- Softcover
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Language: English
Published by Springer, 2021
- Softcover
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Pattern Recognition and Information Forensics : Icpr 2020 International Workshops, Virtual Event, January 10-11, 2021, Proceedings
Del Bimbo, Alberto (EDT); Cucchiara, Rita (EDT); Sclaroff, Stan (EDT); Farinella, Giovanni Maria (EDT); Mei, Tao (EDT)
Language: English
Published by Springer, 2021
- Softcover
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Language: English
Published by Springer, 2021
- Softcover
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Language: English
Published by Springer 2021-02-21, 2021
- Softcover
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Paperback. Condition: New.

Pattern Recognition and Information Forensics : Icpr 2020 International Workshops, Virtual Event, January 10-11, 2021, Proceedings
Del Bimbo, Alberto (EDT); Cucchiara, Rita (EDT); Sclaroff, Stan (EDT); Farinella, Giovanni Maria (EDT); Mei, Tao (EDT)
Language: English
Published by Springer, 2021
- Softcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
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- Softcover
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Condition: New. 1st ed. 2019 edition NO-PA16APR2015-KAP.

Language: English
Published by Springer, 2021
- Softcover
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, IrelandKennys Bookshop and Art Galleries Ltd.
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Language: English
Published by Springer, 2021
- Softcover
Seller: Books Puddle, New York, NY, U.S.A.Books Puddle
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Pattern Recognition and Information Forensics : Icpr 2020 International Workshops, Virtual Event, January 10-11, 2021, Proceedings
Del Bimbo, Alberto (EDT); Cucchiara, Rita (EDT); Sclaroff, Stan (EDT); Farinella, Giovanni Maria (EDT); Mei, Tao (EDT)
Language: English
Published by Springer, 2021
- Softcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
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US$ 78.02
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Language: English
Published by Springer, 2021
- Softcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This 8-volumes set constitutes the refereed of the 25th International Conference on Pattern Recognition Workshops, ICPR 2020, held virtually in Milan, Italy and rescheduled to January 10 - 11, 2021 due to Covid-19 pandemic. The 416 full papers presented in these 8 volumes were carefully reviewed and selected from about 700 submissions. The 46 workshops cover a wide range of areas including machine learning, pattern analysis, healthcare, human behavior, environment, surveillance, forensics and biometrics, robotics and egovision, cultural heritage and document analysis, retrieval, and women at ICPR2020.…

Language: English
Published by Springer, 2021
- Softcover
Seller: Kennys Bookstore, Olney, MD, U.S.A.Kennys Bookstore
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Language: English
Published by Springer-Nature New York Inc, 2021
- Softcover
Seller: Revaluation Books, Exeter, United KingdomRevaluation Books
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Paperback. Condition: Brand New. 520 pages. 9.25x6.10x1.05 inches. In Stock.

Image Analysis and Processing ? Iciap 2022 : 21st International Conference, Lecce, Italy, May 23?27, 2022, Proceedings
Sclaroff, Stan (EDT); Distante, Cosimo (EDT); Leo, Marco (EDT); Farinella, Giovanni M. (EDT); Tombari, Federico (EDT)
- Softcover
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- Softcover
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Condition: New. In.

- Softcover
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Condition: New. In.

- Softcover
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PF. Condition: New.

- Softcover
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Image Analysis and Processing ? Iciap 2022 : 21st International Conference, Lecce, Italy, May 23?27, 2022, Proceedings
Sclaroff, Stan (EDT); Distante, Cosimo (EDT); Leo, Marco (EDT); Farinella, Giovanni M. (EDT); Tombari, Federico (EDT)
- Softcover
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Image Analysis and Processing ? Iciap 2022 : 21st International Conference, Lecce, Italy, May 23?27, 2022, Proceedings
Sclaroff, Stan (EDT); Distante, Cosimo (EDT); Leo, Marco (EDT); Farinella, Giovanni M. (EDT); Tombari, Federico (EDT)
- Softcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
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- Softcover
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Image Analysis and Processing ? Iciap 2022 : 21st International Conference, Lecce, Italy, May 23?27, 2022, Proceedings
Sclaroff, Stan (EDT); Distante, Cosimo (EDT); Leo, Marco (EDT); Farinella, Giovanni M. (EDT); Tombari, Federico (EDT)
- Softcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
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Language: English
Published by Springer, 2021
- Softcover
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Taschenbuch. Condition: Neu. Pattern Recognition. ICPR International Workshops and Challenges | Virtual Event, January 10-15, 2021, Proceedings, Part VIII | Alberto Del Bimbo (u. a.) | Taschenbuch | Lecture Notes in Computer Science | xviii | Englisch | 2021 | Springer | EAN 9783030687922 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.…

Language: English
Published by Springer, 2021
- Softcover
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- Softcover
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Language: English
Published by Springer, 2021
- Softcover
Seller: StainesBookhub, Weybridge, SURRE, United KingdomStainesBookhub
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Language: English
Published by Springer, 2021
- Softcover
Seller: StainesBookhub, Weybridge, SURRE, United KingdomStainesBookhub
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Condition: New. A brand new book in pristine condition. Showing zero signs of shelf wear, creases, or damage.

Language: English
Published by Springer, 2021
- Softcover
Seller: StainesBookhub, Weybridge, SURRE, United KingdomStainesBookhub
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Condition: New. A brand new book in pristine condition. Showing zero signs of shelf wear, creases, or damage.

Language: English
Published by Springer, 2021
- Softcover
Seller: StainesBookhub, Weybridge, SURRE, United KingdomStainesBookhub
Contact seller2-star sellerCondition: New
US$ 100.00
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Condition: New. A brand new book in pristine condition. Showing zero signs of shelf wear, creases, or damage.

Language: English
Published by Springer, 2021
- Softcover
Seller: StainesBookhub, Weybridge, SURRE, United KingdomStainesBookhub
Contact seller2-star sellerCondition: New
US$ 100.00
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Condition: New. A brand new book in pristine condition. Showing zero signs of shelf wear, creases, or damage.