Trzaska Hubert (25 results)
- Hardcover
- First Edition
Seller: Feldman's Books, Menlo Park, CA, U.S.A.Feldman's Books
Contact seller4-star sellerCondition: Used
US$ 60.00
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Hardcover. Condition: Very Fine. First Edition. No markings.
Language: English
Published by Scitech, NJ 2014
- Hardcover
Seller: Feldman's Books, Menlo Park, CA, U.S.A.Feldman's Books
Contact seller4-star sellerHardcover. Condition: Very Fine. First Edition. No markings.
- Hardcover
Seller: HPB-Red, Dallas, TX, U.S.A.HPB-Red
Contact seller5-star sellerCondition: Used - Good
US$ 75.01
US$ 3.75 shippingShips within U.S.A.Quantity: 1 available
Hardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority.
- Hardcover
Seller: Banbury Road Books, Fountain Valley, CA, U.S.A.Banbury Road Books
Contact seller5-star sellerCondition: New
US$ 75.00
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Hardcover. Condition: New. Clean, unread copy in New condition. No marking or writing in the book - text is completely clean, and the book appears unread. Book is still in plastic shrink-wrap from the publisher. Covers are clean and show no shelf wear. Printed hardcover as issued by the publisher - no dust jacket. Binding is fir…m.
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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US$ 112.53
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Condition: New.
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: New
US$ 119.89
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Condition: New.
- Hardcover
Seller: Rarewaves USA, OSWEGO, IL, U.S.A.Rarewaves USA
Contact seller5-star sellerCondition: New
US$ 122.54
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Hardback. Condition: New. Electromagnetic Field Standards and Exposure Systems covers the broader fields of measurements in telecommunications, radio navigation, radio astronomy, bioscience, and free ranging EM radiation and helps to develop the following measurement standards; proper calibration of the measuring instrumentexter…nal environmental factors that affect accuracycompetence and training of the instrument operator.
- Hardcover
Seller: Rarewaves USA, OSWEGO, IL, U.S.A.Rarewaves USA
Contact seller5-star sellerCondition: New
US$ 122.75
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Hardback. Condition: New. This book is devoted to the specific problems of electromagnetic field (EMF) measurements in the near field and to the analysis of the main factors which impede accuracy in these measurements. It focuses on careful and accurate design of systems to measure in the near field based on a thorough understan…ding of the fundamental engineering principles and on an analysis of the likely system errors. Beginning with a short introduction to electromagnetic fields with an emphasis on the near field, it then presents methods of EMF measurements in near field conditions. It details the factors limiting measurement accuracy including internal ones (thermal stability, frequency response, dynamic characteristics, susceptibility) and external ones (field integration, mutual couplings between a probe and primary and secondary EMF sources, directional pattern deformations). It continues with a discussion on how to gauge the parameters declared by an EMF meter manufacturer and simple methods for testing these parameters. It also details how designers of measuring equipment can reconsider the near field when designing and testing, as well as how users can exploit the knowledge within the book to ensure their tests and results contain the most accurate measurements possible. The SciTech Publishing Series on Electromagnetic Compatibility provides a continuously growing body of knowledge in the latest development and best practices in electromagnetic compatibility engineering. This series provides specialist and non-specialist professionals and students practical knowledge that is thoroughly grounded in relevant theory.
- Hardcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
Contact seller5-star sellerCondition: New
US$ 106.92
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Condition: New.
- Hardcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
Contact seller5-star sellerCondition: New
US$ 111.25
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Condition: New. In.
- Hardcover
Seller: Rarewaves.com USA, London, LONDO, United KingdomRarewaves.com USA
Contact seller5-star sellerCondition: New
US$ 135.70
Free ShippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Hardback. Condition: New. This book is devoted to the specific problems of electromagnetic field (EMF) measurements in the near field and to the analysis of the main factors which impede accuracy in these measurements. It focuses on careful and accurate design of systems to measure in the near field based on a thorough understan…ding of the fundamental engineering principles and on an analysis of the likely system errors. Beginning with a short introduction to electromagnetic fields with an emphasis on the near field, it then presents methods of EMF measurements in near field conditions. It details the factors limiting measurement accuracy including internal ones (thermal stability, frequency response, dynamic characteristics, susceptibility) and external ones (field integration, mutual couplings between a probe and primary and secondary EMF sources, directional pattern deformations). It continues with a discussion on how to gauge the parameters declared by an EMF meter manufacturer and simple methods for testing these parameters. It also details how designers of measuring equipment can reconsider the near field when designing and testing, as well as how users can exploit the knowledge within the book to ensure their tests and results contain the most accurate measurements possible. The SciTech Publishing Series on Electromagnetic Compatibility provides a continuously growing body of knowledge in the latest development and best practices in electromagnetic compatibility engineering. This series provides specialist and non-specialist professionals and students practical knowledge that is thoroughly grounded in relevant theory.
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: Used - As new
US$ 137.58
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Condition: As New. Unread book in perfect condition.
- Hardcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
Contact seller5-star sellerCondition: New
US$ 128.83
US$ 19.87 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: New.
- Hardcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
Contact seller5-star sellerCondition: Used - As new
US$ 149.49
US$ 19.87 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: As New. Unread book in perfect condition.
- Hardcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
Contact seller5-star sellerCondition: Used - As new
US$ 150.07
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Condition: As New. Unread book in perfect condition.
- Hardcover
Seller: Mispah books, Redhill, SURRE, United KingdomMispah books
Contact seller4-star sellerCondition: Used - As new
US$ 139.17
US$ 33.12 shippingShips from United Kingdom to U.S.A.Quantity: 1 available
Hardcover. Condition: Like New. Like New. book.
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: Used - As new
US$ 169.44
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Condition: As New. Unread book in perfect condition.
- Hardcover
Seller: Rarewaves USA United, OSWEGO, IL, U.S.A.Rarewaves USA United
Contact seller5-star sellerCondition: New
US$ 128.84
US$ 50.00 shippingShips within U.S.A.Quantity: Over 20 available
Hardback. Condition: New. Electromagnetic Field Standards and Exposure Systems covers the broader fields of measurements in telecommunications, radio navigation, radio astronomy, bioscience, and free ranging EM radiation and helps to develop the following measurement standards; proper calibration of the measuring instrumentexter…nal environmental factors that affect accuracycompetence and training of the instrument operator.
- Hardcover
Seller: Rarewaves USA United, OSWEGO, IL, U.S.A.Rarewaves USA United
Contact seller5-star sellerCondition: New
US$ 129.06
US$ 50.00 shippingShips within U.S.A.Quantity: Over 20 available
Hardback. Condition: New. This book is devoted to the specific problems of electromagnetic field (EMF) measurements in the near field and to the analysis of the main factors which impede accuracy in these measurements. It focuses on careful and accurate design of systems to measure in the near field based on a thorough understan…ding of the fundamental engineering principles and on an analysis of the likely system errors. Beginning with a short introduction to electromagnetic fields with an emphasis on the near field, it then presents methods of EMF measurements in near field conditions. It details the factors limiting measurement accuracy including internal ones (thermal stability, frequency response, dynamic characteristics, susceptibility) and external ones (field integration, mutual couplings between a probe and primary and secondary EMF sources, directional pattern deformations). It continues with a discussion on how to gauge the parameters declared by an EMF meter manufacturer and simple methods for testing these parameters. It also details how designers of measuring equipment can reconsider the near field when designing and testing, as well as how users can exploit the knowledge within the book to ensure their tests and results contain the most accurate measurements possible. The SciTech Publishing Series on Electromagnetic Compatibility provides a continuously growing body of knowledge in the latest development and best practices in electromagnetic compatibility engineering. This series provides specialist and non-specialist professionals and students practical knowledge that is thoroughly grounded in relevant theory.
- Hardcover
Seller: Revaluation Books, Exeter, , United KingdomRevaluation Books
Contact seller5-star sellerCondition: New
US$ 169.47
US$ 13.25 shippingShips from United Kingdom to U.S.A.Quantity: 2 available
Hardcover. Condition: Brand New. 201 pages. 9.00x6.00x0.75 inches. In Stock.
- Hardcover
Seller: Revaluation Books, Exeter, , United KingdomRevaluation Books
Contact seller5-star sellerCondition: New
US$ 169.76
US$ 13.25 shippingShips from United Kingdom to U.S.A.Quantity: 2 available
Hardcover. Condition: Brand New. 2nd revised edition edition. 230 pages. 9.09x6.10x0.71 inches. In Stock.
- Hardcover
Seller: moluna, Greven, , Germanymoluna
Contact seller5-star sellerCondition: New
US$ 127.02
US$ 55.98 shippingShips from Germany to U.S.A.Quantity: Over 20 available
Condition: New. Über den AutorrnrnPawel Bienkowski is affiliated with the EM Environment Protection Lab at the Technical University of Wroclaw, Poland where he researches electromagnetic compatibility and electromagnetic field measurements and standards.
- Hardcover
Seller: moluna, Greven, , Germanymoluna
Contact seller5-star sellerCondition: New
US$ 130.11
US$ 55.98 shippingShips from Germany to U.S.A.Quantity: Over 20 available
Condition: New. Über den AutorrnrnDr Eugeniusz Grudzinski, born in 1948 in Wroclaw, Poland. He completed his MSc EE, DSc and Ph.Dr. degrees at the Technical University of Wroclaw in 1973, 1981 and 1998, respectively. He is currently Head of the EMF Stan.
- Hardcover
Seller: Rarewaves.com UK, London, United KingdomRarewaves.com UK
Contact seller5-star sellerCondition: New
US$ 131.25
US$ 86.10 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Hardback. Condition: New. This book is devoted to the specific problems of electromagnetic field (EMF) measurements in the near field and to the analysis of the main factors which impede accuracy in these measurements. It focuses on careful and accurate design of systems to measure in the near field based on a thorough understan…ding of the fundamental engineering principles and on an analysis of the likely system errors. Beginning with a short introduction to electromagnetic fields with an emphasis on the near field, it then presents methods of EMF measurements in near field conditions. It details the factors limiting measurement accuracy including internal ones (thermal stability, frequency response, dynamic characteristics, susceptibility) and external ones (field integration, mutual couplings between a probe and primary and secondary EMF sources, directional pattern deformations). It continues with a discussion on how to gauge the parameters declared by an EMF meter manufacturer and simple methods for testing these parameters. It also details how designers of measuring equipment can reconsider the near field when designing and testing, as well as how users can exploit the knowledge within the book to ensure their tests and results contain the most accurate measurements possible. The SciTech Publishing Series on Electromagnetic Compatibility provides a continuously growing body of knowledge in the latest development and best practices in electromagnetic compatibility engineering. This series provides specialist and non-specialist professionals and students practical knowledge that is thoroughly grounded in relevant theory.
Language: English
Published by Institution Of Engineering & Technology Jun 2012 2012
- Hardcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
Contact seller5-star sellerCondition: New
US$ 156.91
US$ 71.28 shippingShips from Germany to U.S.A.Quantity: 2 available
Buch. Condition: Neu. Neuware - This book is devoted to the specific problems of electromagnetic field (EMF) measurements in the near field and to the analysis of the main factors which impede accuracy in these measurements. It focuses on careful and accurate design of systems to measure in the near field based on a thorough und…erstanding of the fundamental engineering principles and on an analysis of the likely system errors. Beginning with a short introduction to electromagnetic fields with an emphasis on the near field, it then presents methods of EMF measurements in near field conditions. It details the factors limiting measurement accuracy including internal ones (thermal stability, frequency response, dynamic characteristics, susceptibility) and external ones (field integration, mutual couplings between a probe and primary and secondary EMF sources, directional pattern deformations). It continues with a discussion on how to gauge the parameters declared by an EMF meter manufacturer and simple methods for testing these parameters. It also details how designers of measuring equipment can reconsider the near field when designing and testing, as well as how users can exploit the knowledge within the book to ensure their tests and results contain the most accurate measurements possible. The SciTech Publishing Series on Electromagnetic Compatibility provides a continuously growing body of knowledge in the latest development and best practices in electromagnetic compatibility engineering. This series provides specialist and non-specialist professionals and students practical knowledge that is thoroughly grounded in relevant theory.
