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Atomic Force Microscopy
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 172.44
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Atomic Force Microscopy (NanoScience and Technology)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
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US$ 195.54
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Atomic Force Microscopy
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 194.71
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Atomic Force Microscopy
Language: English
Published by Springer Nature Switzerland AG, CH, 2019
ISBN 10: 3030136531 ISBN 13: 9783030136536
Seller: Rarewaves.com USA, London, LONDO, United Kingdom
Seller rating 5 out of 5 stars
Hardback. Condition: New. Second Edition 2019.
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Condition: New.
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Atomic Force Microscopy
Language: English
Published by Springer International Publishing, 2019
ISBN 10: 3030136531 ISBN 13: 9783030136536
Condition: New. Offers a full color pedagogic approach to atomic force microscopyPresents the fundamentals of the technique in detailDiscusses related technical aspects in depthProf. Dr. rer. nat. Bert Voigtlaender studied Physics at the Univ.
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Scanning Probe Microscopy
Language: English
Published by Springer Berlin Heidelberg, 2016
ISBN 10: 3662505576 ISBN 13: 9783662505571
US$ 214.05
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Scanning Probe Microscopy
Language: English
Published by Springer Berlin Heidelberg, 2015
ISBN 10: 3662452391 ISBN 13: 9783662452394
US$ 214.05
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Atomic Force Microscopy
Language: English
Published by Springer International Publishing, Springer Nature Switzerland, 2020
ISBN 10: 3030136566 ISBN 13: 9783030136567
Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to 'Scanning Probe Microscopy' (Springer, 2015)represents a substantial extension andrevision to the part on atomic force microscopy of the previous book. Covering both fundamental and important technical aspects of atomic force microscopy, this book concentrates on the principles the methods using a didactic approach in an easily digestible manner.Whileprimarily aimed at graduate students in physics, materials science, chemistry, nanoscience and engineering, this bookis also usefulfor professionals and newcomers in the field, and is an ideal reference book in any atomic force microscopy lab.
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Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to 'Scanning Probe Microscopy' (Springer, 2015)represents a substantial extension andrevision to the part on atomic force microscopy of the previous book. Covering both fundamental and important technical aspects of atomic force microscopy, this book concentrates on the principles the methods using a didactic approach in an easily digestible manner.Whileprimarily aimed at graduate students in physics, materials science, chemistry, nanoscience and engineering, this bookis also usefulfor professionals and newcomers in the field, and is an ideal reference book in any atomic force microscopy lab.
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Taschenbuch. Condition: Neu. Scanning Probe Microscopy | Atomic Force Microscopy and Scanning Tunneling Microscopy | Bert Voigtländer | Taschenbuch | NanoScience and Technology | xv | Englisch | 2016 | Springer | EAN 9783662505571 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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Buch. Condition: Neu. Atomic Force Microscopy | Bert Voigtländer | Buch | xiv | Englisch | 2019 | Springer | EAN 9783030136536 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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Atomic Force Microscopy
Language: English
Published by Springer Nature Switzerland AG, CH, 2019
ISBN 10: 3030136531 ISBN 13: 9783030136536
US$ 225.49
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Add to basketHardback. Condition: New. Second Edition 2019.
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US$ 283.52
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Add to basketHardcover. Condition: New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.
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Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.
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US$ 315.69
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Add to basketPaperback. Condition: Brand New. 2nd edition. 348 pages. 9.25x6.10x0.82 inches. In Stock.
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US$ 318.02
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Add to basketHardcover. Condition: Brand New. 2nd ed. 2019 edition. 348 pages. 9.25x6.10x0.94 inches. In Stock.
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US$ 338.05
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US$ 347.58
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Add to basketPaperback. Condition: Brand New. reprint edition. 397 pages. 9.00x6.00x1.00 inches. In Stock.
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Condition: new. Questo è un articolo print on demand.
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Condition: new. Questo è un articolo print on demand.
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Condition: new. Questo è un articolo print on demand.
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Condition: new. Questo è un articolo print on demand.
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Atomic Force Microscopy
Language: English
Published by Springer, Springer Aug 2020, 2020
ISBN 10: 3030136566 ISBN 13: 9783030136567
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to 'Scanning Probe Microscopy' (Springer, 2015)represents a substantial extension andrevision to the part on atomic force microscopy of the previous book. Covering both fundamental and important technical aspects of atomic force microscopy, this book concentrates on the principles the methods using a didactic approach in an easily digestible manner.Whileprimarily aimed at graduate students in physics, materials science, chemistry, nanoscience and engineering, this bookis also usefulfor professionals and newcomers in the field, and is an ideal reference book in any atomic force microscopy lab. 348 pp. Englisch.
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Atomic Force Microscopy
Language: English
Published by Springer International Publishing, 2020
ISBN 10: 3030136566 ISBN 13: 9783030136567
US$ 182.74
US$ 56.54 shipping
Ships from Germany to U.S.A.Quantity: Over 20 available
Add to basketKartoniert / Broschiert. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Offers a full color pedagogic approach to atomic force microscopyPresents the fundamentals of the technique in detailDiscusses related technical aspects in depthProf. Dr. rer. nat. Bert Voigtlaender studied Physics at the Univ.
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US$ 225.17
US$ 16.54 shipping
Ships from United Kingdom to U.S.A.Quantity: 1 available
Add to basketHardcover. Condition: Brand New. 2nd ed. 2019 edition. 348 pages. 9.25x6.10x0.94 inches. In Stock. This item is printed on demand.
